Onto Innovation’s Dragonfly® Inspection Platform Projecting Record Annual Growth in 2021
Onto Innovation Inc. (NYSE: ONTO) reported a 50% growth in unit volumes of its Dragonfly inspection system in H1 2021, with expectations of a 70% compound annual growth rate (CAGR) from 2018 to 2021. The company’s Dragonfly G3 platform has attracted tier 1 customers, enhancing sensitivity and throughput. This innovation is pivotal for the semiconductor industry, particularly in 5G and AI applications. Onto Innovation aims to solve complex challenges in process control and yield improvement, further solidifying its market presence.
- 50% growth in Dragonfly system unit volumes in H1 2021.
- Projected 70% CAGR from 2018 to 2021.
- Dragonfly G3 offers sub-micron sensitivity and 30% higher throughput than previous models.
- Adoption by tier 1 customers, including top foundries and integrated device manufacturers.
- None.
Dragonfly system growth accelerated by tier 1 customer adoption
In addition to the projected growth of the Dragonfly system, the Company’s portfolio of inspection platforms being delivered in 2021, which includes the Firefly® panel inspection system, the NSX® 330 inspection system and the F30™ inspection system, is also expected to experience substantial growth.
“When we released the Dragonfly system, we hoped it would reset the industry's expectations for sensitivity, throughput, accuracy, footprint and reliability,” said Dr.
Tier 1 customers, including major integrated device manufacturers (IDMs) and the top foundries, have adopted the Dragonfly G3 system, the newest model of the Dragonfly family. The Dragonfly G3 platform offers sub-micron sensitivity,
“Fine-pitch RDLs require high sensitivity with a very low noise level to identify killer defects on the surface. The Dragonfly G3 system not only addresses those challenges, but also excels at providing high-value data streams while our TrueADC® software powered by AI technology eliminates the need for manual review by human inspectors to determine the severity and yield impact of minor defects,” said Onto Innovation’s
In addition, the inspection system is being adopted by manufacturers of CMOS image sensor (CIS) devices, a rising segment of the semiconductor industry. The reason: the Dragonfly G3 system can detect low contrast defects thanks to Onto Innovation’s advanced image processing technology based on machine learning and artificial intelligence.
“The Dragonfly G3 system is a unique solution for CIS devices, one that provides better sensitivity than any other solution on the market,” said Tsai. “Previously, customers used two inspection tools to detect all defects, but with the Dragonfly G3 system, they can comprehensively inspect for defects on a single platform on a single pass. No other system can do that at the same speed.”
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Additional information can be found at www.ontoinnovation.com.
Forward Looking Statements
This press release contains forward-looking statements within the meaning of the Private Securities Litigation Reform Act of 1995 (the “Act”) which include Onto Innovation’s business momentum and future growth; the benefit to customers of Onto Innovation’s products and customer service; Onto Innovation’s ability to both deliver products and services consistent with our customers’ demands and expectations and strengthen its market position as well as other matters that are not purely historical data.
Source:
View source version on businesswire.com: https://www.businesswire.com/news/home/20210831006047/en/
Investor Relations:
mike.sheaffer@ontoinnovation.com
amy.shay@ontoinnovation.com
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