Aehr Receives Volume Production Order for WaferPak Full Wafer Contactors from Major Silicon Carbide Semiconductor Customer for Test and Burn-in of Silicon Carbide Semiconductor Wafers
Aehr Test Systems (NASDAQ: AEHR) has received a significant order from its second major customer in the silicon carbide semiconductor sector for WaferPak™ full wafer Contactors. These products will be used with FOX-XP™ systems to test and burn-in silicon carbide semiconductor wafers. The initial shipments will commence in the current fiscal fourth quarter, starting March 1, 2023. The customer also plans to scale up operations significantly, leading to potential growth in Aehr's capacity. Market forecasts predict a substantial increase in silicon carbide wafer demand, particularly for electric vehicles, with a CAGR of 48.4% projected through 2030.
- Received a significant order from a second major silicon carbide semiconductor customer.
- Initial shipments of WaferPak Contactors to begin in the current fiscal quarter.
- Customer plans to significantly increase production capacity, indicating potential long-term growth for Aehr.
- Market forecasts show a projected CAGR of 48.4% for silicon carbide wafers in electric vehicles until 2030.
- None.
FREMONT, Calif., March 21, 2023 (GLOBE NEWSWIRE) -- Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of semiconductor test and reliability qualification equipment, today announced it has received an order from its second major silicon carbide semiconductor customer for production quantities of WaferPak™ full wafer Contactors to be used with previously ordered FOX-XP™ systems for test and burn-in of silicon carbide semiconductor wafers in their production facility. Shipments of these WaferPaks will begin in Aehr’s current fiscal fourth quarter that began March 1, 2023.
As previously announced, this customer has purchased Aehr’s FOX multi-wafer test and burn-in systems for silicon carbide wafers for devices such as electric vehicle drive unit inverters, electric vehicle chargers, and other devices for use in industrial and photovoltaic inverter applications. Aehr has installed both a FOX-NP system used for new product development and engineering characterization as well as the first of two FOX-XP systems already purchased that will be upgraded to include Aehr’s new fully integrated and automated WaferPak Aligner for volume production test and burn-in of their silicon carbide devices. The new WaferPak AutoAligner will begin shipments in Aehr’s current fiscal quarter.
Gayn Erickson, President and CEO of Aehr Test Systems, commented, “We are excited to receive this order reflecting initial WaferPak purchases from this customer for use in volume production of devices to meet the incredible demand for silicon carbide power semiconductors used in power conversion applications for electric vehicles. We believe that this customer will purchase a large number of our FOX-XP systems to meet their publicly announced significant increase in planned capacity and revenue growth over the next several years and through the end of the decade.
“Forecasts from William Blair estimate that the silicon carbide market for devices in electric vehicles alone, such as traction inverters and on-board chargers, is expected to grow from 119,000 6-inch equivalent silicon carbide wafers for electric vehicles in 2021 to more than 4.1 million 6-inch equivalent wafers in 2030, representing a compound annual growth rate (CAGR) of
“Aehr is adding infrastructure and capacity in design resources and tools, material suppliers, and manufacturing and test of our FOX-XP WaferPaks to meet the anticipated significant growth in demand for these full wafer contactors for the silicon carbide and gallium nitride power semiconductor test and burn-in markets as well as several other markets.”
The FOX-XP and FOX-NP systems, available with multiple WaferPak Contactors (full wafer test) or multiple DiePak™ Carriers (singulated die/module test) configurations, are capable of functional test and burn-in/cycling of devices such as silicon carbide and gallium nitride power semiconductors, silicon photonics as well as other optical devices, 2D and 3D sensors, flash memories, magnetic sensors, microcontrollers, and other leading-edge ICs in either wafer form factor, before they are assembled into single or multi-die stacked packages, or in singulated die or module form factor.
About Aehr Test Systems
Headquartered in Fremont, California, Aehr Test Systems is a worldwide provider of test systems for burning-in semiconductor devices in wafer level, singulated die, and package part form, and has installed over 2,500 systems worldwide. Increased quality and reliability needs of the Automotive and Mobility integrated circuit markets are driving additional test requirements, incremental capacity needs, and new opportunities for Aehr Test products in package, wafer level, and singulated die/module level test. Aehr Test has developed and introduced several innovative products, including the ABTS™ and FOX-P™ families of test and burn-in systems and FOX WaferPak™ Aligner, FOX WaferPak Contactor, FOX DiePak® Carrier and FOX DiePak Loader. The ABTS system is used in production and qualification testing of packaged parts for both lower power and higher power logic devices as well as all common types of memory devices. The FOX-XP and FOX-NP systems are full wafer contact and singulated die/module test and burn-in systems used for burn-in and functional test of complex devices, such as leading-edge silicon carbide-based power semiconductors, memories, digital signal processors, microprocessors, microcontrollers, systems-on-a-chip, and integrated optical devices. The FOX-CP system is a new low-cost single-wafer compact test and reliability verification solution for logic, memory and photonic devices and the newest addition to the FOX-P product family. The WaferPak Contactor contains a unique full wafer probe card capable of testing wafers up to 300mm that enables IC manufacturers to perform test and burn-in of full wafers on Aehr Test FOX systems. The DiePak Carrier is a reusable, temporary package that enables IC manufacturers to perform cost-effective final test and burn-in of both bare die and modules. For more information, please visit Aehr Test Systems’ website at www.aehr.com.
Safe Harbor Statement
This press release contains certain forward-looking statements within the meaning of Section 27A of the Securities Act of 1933 and Section 21E of the Securities Exchange Act of 1934. Forward-looking statements generally relate to future events or Aehr’s future financial or operating performance. In some cases, you can identify forward-looking statements because they contain words such as "may," "will," "should," "expects," "plans," "anticipates,” “going to,” "could," "intends," "target," "projects," "contemplates," "believes," "estimates," "predicts," "potential," or "continue," or the negative of these words or other similar terms or expressions that concern Aehr’s expectations, strategy, priorities, plans, or intentions. Forward-looking statements in this press release include, but are not limited to, future requirements and orders of Aehr’s new and existing customers; bookings forecasted for proprietary WaferPak™ and DiePak consumables; and expectations related to long-term demand for Aehr’s productions and the attractiveness of key markets. The forward-looking statements contained in this press release are also subject to other risks and uncertainties, including those more fully described in Aehr’s recent Form 10-K, 10-Q and other reports filed from time to time with the Securities and Exchange Commission. Aehr disclaims any obligation to update information contained in any forward-looking statement to reflect events or circumstances occurring after the date of this press release.
Contacts:
| Aehr Test Systems | MKR Investor Relations Inc. |
| Vernon Rogers | Todd Kehrli or Jim Byers |
| EVP of Sales & Marketing | Analyst/Investor Contact |
| (510) 623-9400 x215 | (213) 277-5550 |
| vrogers@aehr.com | aehr@mkr-group.com |
