Aehr Announces Initial FOX-XP Multi-wafer Test and Burn-in Production System Order from Major Gallium Nitride Power Semiconductor Supplier
Aehr Test Systems (NASDAQ:AEHR) has received an initial production order from a major automotive semiconductor supplier for a FOX-XP wafer level test and burn-in system with integrated FOX WaferPak Aligner for GaN power semiconductor device testing. The system is scheduled for immediate shipment.
The customer has been using a FOX-NP system for over a year under an evaluation agreement, successfully qualifying various GaN device types for industrial, solar, data center, and automotive applications. The FOX-XP system can test up to nine wafers in parallel and is designed for high-voltage testing and high-temperature stress testing.
According to market projections, the GaN market is expected to grow at a 40% CAGR, reaching $2.5 billion in annual device sales by 2029. Frost & Sullivan estimates GaN semiconductors will represent over 10% of the worldwide power semiconductor industry by 2028.
Aehr Test Systems (NASDAQ:AEHR) ha ricevuto un ordine di produzione iniziale da un importante fornitore di semiconduttori per l'automotive per un sistema di test e burn-in a livello wafer FOX-XP, con un FOX WaferPak Aligner integrato per il testing di dispositivi semiconduttori GaN. Il sistema è previsto per la spedizione immediata.
Il cliente utilizza un sistema FOX-NP da oltre un anno nell'ambito di un contratto di valutazione, qualificando con successo vari tipi di dispositivi GaN per applicazioni industriali, solari, nei datacenter e automotive. Il sistema FOX-XP può testare fino a nove wafer in parallelo ed è progettato per test ad alta tensione e stress termico ad alta temperatura.
Secondo le proiezioni di mercato, si prevede che il mercato GaN cresca a un 40% CAGR, raggiungendo 2,5 miliardi di dollari in vendite annuali di dispositivi entro il 2029. Frost & Sullivan stima che i semiconduttori GaN rappresenteranno oltre il 10% dell'industria globale dei semiconduttori di potenza entro il 2028.
Aehr Test Systems (NASDAQ:AEHR) ha recibido una orden de producción inicial de un importante proveedor de semiconductores para la automoción para un sistema de prueba y burn-in a nivel de wafer FOX-XP, con un Alinador FOX WaferPak integrado para la prueba de dispositivos de semiconductores de potencia GaN. El sistema está programado para su envío inmediato.
El cliente ha estado utilizando un sistema FOX-NP durante más de un año bajo un acuerdo de evaluación, calificando con éxito varios tipos de dispositivos GaN para aplicaciones industriales, solares, de centros de datos y automotrices. El sistema FOX-XP puede probar hasta nueve wafers en paralelo y está diseñado para pruebas de alta tensión y pruebas de estrés a alta temperatura.
Según las proyecciones del mercado, se espera que el mercado de GaN crezca a una CAGR del 40%, alcanzando 2.5 mil millones de dólares en ventas anuales de dispositivos para 2029. Frost & Sullivan estima que los semiconductores de GaN representarán más del 10% de la industria mundial de semiconductores de potencia para 2028.
Aehr Test Systems (NASDAQ:AEHR)는 주요 자동차 반도체 공급업체로부터 GaN 전력 반도체 장치 테스트를 위한 FOX WaferPak 정렬기와 통합된 FOX-XP 웨이퍼 레벨 테스트 및 번인 시스템에 대한 초기 생산 주문을 받았습니다. 이 시스템은 즉시 배송될 예정입니다.
고객은 평가 계약에 따라 1년 이상 FOX-NP 시스템을 사용하여 산업, 태양광, 데이터 센터 및 자동차 응용 분야에 대한 다양한 GaN 장치 유형을 성공적으로 검증하였습니다. FOX-XP 시스템은 최대 아홉 개의 웨이퍼를 병렬로 테스트할 수 있으며, 고전압 테스트와 고온 스트레스 테스트를 위해 설계되었습니다.
시장 전망에 따르면, GaN 시장은 40% CAGR로 성장할 것으로 예상되며, 2029년까지 연간 장치 판매가 25억 달러에 이를 것으로 보입니다. Frost & Sullivan은 GaN 반도체가 2028년까지 세계 전력 반도체 시장의 10% 이상을 차지할 것으로 추정합니다.
Aehr Test Systems (NASDAQ:AEHR) a reçu une commande de production initiale d'un grand fournisseur de semi-conducteurs pour l'automobile pour un système de test et de burn-in à niveau wafer FOX-XP, avec un Aligneur FOX WaferPak intégré pour les tests de dispositifs semi-conducteurs de puissance GaN. Le système est prévu pour un envoi immédiat.
Le client utilise un système FOX-NP depuis plus d'un an dans le cadre d'un accord d'évaluation, qualifiant avec succès divers types de dispositifs GaN pour des applications industrielles, solaires, de centres de données et automobiles. Le système FOX-XP peut tester jusqu'à neuf wafers en parallèle et est conçu pour des tests à haute tension et des tests de contrainte à haute température.
Selon les prévisions du marché, le marché GaN devrait croître à un CAGRe de 40%, atteignant 2,5 milliards de dollars de ventes annuelles de dispositifs d'ici 2029. Frost & Sullivan estime que les semi-conducteurs GaN représenteront plus de 10% de l'industrie mondiale des semi-conducteurs de puissance d'ici 2028.
Aehr Test Systems (NASDAQ:AEHR) hat einen ersten Produktionsauftrag von einem großen Lieferanten von Automobilhalbleitern für ein FOX-XP Wafer-Level-Test- und Burn-In-System mit integriertem FOX WaferPak-Aligner für Tests von GaN-Leistungs-Halbleitergeräten erhalten. Das System ist für den sofortigen Versand geplant.
Der Kunde verwendet seit über einem Jahr ein FOX-NP-System im Rahmen eines Evaluierungsvertrags und hat erfolgreich verschiedene GaN-Gerätetypen für industrielle, solarbetriebene, Rechenzentrum- und Automobilanwendungen qualifiziert. Das FOX-XP-System kann bis zu neun Wafer parallel testen und ist für Hochspannungstests und Hochtemperatur-Stresstests ausgelegt.
Laut Marktprognosen wird erwartet, dass der GaN-Markt mit einer CAGR von 40% wächst und bis 2029 einen Umsatz von 2,5 Milliarden Dollar an jährlichen Gerätesales erreicht. Frost & Sullivan schätzt, dass GaN-Halbleiter bis 2028 über 10% der weltweiten Halbleiterbranche für Leistung repräsentieren werden.
- Secured initial production order from major automotive semiconductor supplier
- Customer commits to volume production after successful year-long evaluation
- System offers scalability for testing wafers from 6 to 12 inches
- Target market projected to reach $2.5B by 2029 with 40% CAGR
- None.
Insights
The initial FOX-XP system order from a major GaN power semiconductor supplier marks a strategic expansion into the high-growth GaN market. The customer's transition from evaluation to production signals strong confidence in Aehr's testing solutions. The
The FOX-XP's ability to test up to 9 wafers simultaneously while handling high-voltage and temperature stress testing positions Aehr competitively in the GaN space. The platform's flexibility to accommodate various wafer sizes (6-12 inches) through WaferPak upgrades enhances customer value proposition and potential recurring revenue streams.
This order validates Aehr's strategic positioning in the GaN power semiconductor testing market. GaN's superior efficiency in sub-1000W applications makes it ideal for consumer electronics power converters and increasingly important in automotive and data center applications. The projection that GaN will capture
The customer's extensive year-long evaluation using the FOX-NP system and subsequent production order demonstrates the technical merit of Aehr's testing platform. The seamless scalability from FOX-NP to FOX-XP provides a clear pathway for customers transitioning from qualification to high-volume production.
This initial production order is particularly significant as it comes from a top-tier automotive semiconductor supplier, validating Aehr's technology in a demanding sector. The customer's diverse target markets - industrial, solar, data center and automotive - indicate strong potential for follow-on orders as GaN adoption accelerates across these sectors.
The timing aligns with industry forecasts predicting GaN's growing role in power conversion applications, especially in solar panels where it's expected to replace silicon technology. This positions Aehr to capture market share in multiple high-growth segments, potentially driving significant revenue expansion as the GaN market approaches its projected
FREMONT, CA / ACCESSWIRE / January 7, 2025 / Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced it has received an initial production order from a top tier automotive semiconductor supplier for a FOX-XP™ wafer level test and burn-in system with fully integrated FOX WaferPak™ Aligner for production test of their gallium nitride (GaN) power semiconductor devices. The FOX-XP system with integrated WaferPak Aligner is scheduled to ship immediately.
Gayn Erickson, President and CEO of Aehr Test Systems, commented, "We have been working closely with this customer for over a year to support their evaluation and qualification process for delivering GaN power semiconductor devices to their customers. We are thrilled to receive this initial production purchase order, signaling their commitment to move forward with volume production wafer level burn-in of their GaN devices on our FOX-XP platform.
"This customer has extensively utilized a FOX-NP system under an evaluation agreement for production qualification and reliability testing of their devices over the past year. As part of the evaluation, they purchased a significant number of our proprietary WaferPak full wafer Contactors to successfully qualify a wide range of GaN device types designed for multiple end use applications including industrial, solar, data center, and automotive markets.
"Our FOX-P platform allows customers using the FOX-NP for device qualification and reliability testing of power semiconductors like GaN and silicon carbide (SiC) to transition seamlessly to the FOX-XP multi-wafer fully automated system, which is capable of testing up to nine wafers in parallel and is specifically designed to handle high-voltage testing and high temperature Gate and Drain stress test requirements. By leveraging our FOX-XP system and our proprietary WaferPak full wafer Contactors, customers can easily test wafers of varying sizes from 6 to 12 inches by simply purchasing new WaferPaks, while utilizing the same FOX-XP system and FOX WaferPak Aligner.
"Like SiC, GaN semiconductor MOSFETs are wide bandgap devices that offer significantly higher power conversion efficiency than silicon. GaN is particularly well suited for lower power applications such as sub-1000-watt power converters (fast chargers) used in consumer electronics like cell phones, tablets, and laptops. Additionally, it is increasingly being adopted for automotive power converters, supporting electrical systems in both electric and traditional gasoline-powered cars, as well as being targeted at data center power applications where power efficiency and delivery are critical to support the massive amount of computing power and data storage being installed over the next decade. Along with the increased usage in automotive and data centers, many industry experts and analysts predict that GaN MOSFETs will eventually replace silicon as the preferred technology for power conversion in photovoltaic (solar panel) applications.
"We view GaN as a transformative and rapidly growing technology in the power semiconductor market. With an anticipated compound annual growth rate of more than
The FOX-XP and FOX-NP systems, available with multiple WaferPak Contactors (full wafer test) or multiple DiePakTM Carriers (singulated die/module test) configurations, are capable of functional test and burn-in/cycling of devices such as silicon carbide and gallium nitride power semiconductors, artificial intelligence processors, silicon photonics as well as other optical devices, 2D and 3D sensors, flash memories, magnetic sensors, microcontrollers, and other leading-edge ICs in either wafer form factor, before they are assembled into single or multi-die stacked packages, or in singulated die or module form factor.
About Aehr Test Systems
Headquartered in Fremont, California, Aehr Test Systems is a leading provider of test solutions for testing, burning-in, and stabilizing semiconductor devices in wafer level, singulated die, and package part form, and has installed thousands of systems worldwide. Increasing quality, reliability, safety, and security needs of semiconductors used across multiple applications, including electric vehicles, electric vehicle charging infrastructure, solar and wind power, computing, data and telecommunications infrastructure, and solid-state memory and storage, are driving additional test requirements, incremental capacity needs, and new opportunities for Aehr Test products and solutions. Aehr has developed and introduced several innovative products including the FOX-PTM families of test and burn-in systems and FOX WaferPakTM Aligner, FOX WaferPak Contactor, FOX DiePak® Carrier and FOX DiePak Loader. The FOX-XP and FOX-NP systems are full wafer contact and singulated die/module test and burn-in systems that can test, burn-in, and stabilize a wide range of devices such as leading-edge artificial intelligence processors, silicon carbide-based and other power semiconductors, 2D and 3D sensors used in mobile phones, tablets, and other computing devices, memory semiconductors, processors, microcontrollers, systems-on-a-chip, and photonics and integrated optical devices. The FOX-CP system is a low-cost single-wafer compact test solution for logic, memory and photonic devices and the newest addition to the FOX-P product family. The FOX WaferPak Contactor contains a unique full wafer contactor capable of testing wafers up to 300mm that enables IC manufacturers to perform test, burn-in, and stabilization of full wafers on the FOX-P systems. The FOX DiePak Carrier allows testing, burning in, and stabilization of singulated bare die and modules up to 1024 devices in parallel per DiePak on the FOX-NP and FOX-XP systems up to nine DiePaks at a time. Acquired through its acquisition of Incal Technology, Inc., Aehr's new line of high-power packaged part reliability/burn-in test solutions for Artificial Intelligence (AI) semiconductor manufacturers, including its ultra-high-power Sonoma family of test solutions for AI accelerators, GPUs, and high-performance computing (HPC) processors, position Aehr within the rapidly growing AI market as a turn-key provider of reliability and testing that span from engineering to high volume production. For more information, please visit Aehr Test Systems' website at www.aehr.com.
Safe Harbor Statement
This press release contains certain forward-looking statements within the meaning of Section 27A of the Securities Act of 1933 and Section 21E of the Securities Exchange Act of 1934. Forward-looking statements generally relate to future events or Aehr's future financial or operating performance. In some cases, you can identify forward-looking statements because they contain words such as "may," "will," "should," "expects," "plans," "anticipates," "going to," "could," "intends," "target," "projects," "contemplates," "believes," "estimates," "predicts," "potential," or "continue," or the negative of these words or other similar terms or expressions that concern Aehr's expectations, strategy, priorities, plans, or intentions. Forward-looking statements in this press release include, but are not limited to, future requirements and orders of Aehr's new and existing customers; Aehr's ability to receive orders and generate revenue in the future, as well as Aehr's beliefs regarding the factors impacting the foregoing, including the growth of the markets referred to herein; Aehr's ability to integrate Incal efficiently; the timing and extent to which the acquisition is accretive; the closing of the acquisition; and the growth of the markets referred to herein. The forward-looking statements contained in this press release are also subject to other risks and uncertainties, including those more fully described in Aehr's recent Form 10-K, 10-Q and other reports filed from time to time with the Securities and Exchange Commission. Aehr disclaims any obligation to update information contained in any forward-looking statement to reflect events or circumstances occurring after the date of this press release.
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Aehr Test Systems
Vernon Rogers
EVP of Sales & Marketing
(510) 623-9400 x215
vrogers@aehr.com
MKR Investor Relations Inc.
Todd Kehrli or Jim Byers
Analyst/Investor Contact
(213) 277-5550
aehr@mkr-group.com
SOURCE: Aehr Test Systems
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FAQ
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