Aehr Test Systems to Present Virtually at the 27th Annual Needham Growth Conference on January 16, 2025
Aehr Test Systems (NASDAQ:AEHR) announced its upcoming virtual presentation at the 27th Annual Needham Growth Conference on January 16th, 2025, at 3:00 pm ET. CEO Gayn Erickson and CFO Chris Siu will present and host investor meetings throughout the day.
The company will discuss its wafer level test and package part burn-in solutions for semiconductor production, including their recent acquisition of Incal Technology and new high-power packaged part reliability solutions targeting the AI semiconductor market.
Aehr's solutions focus on improving quality, reliability, and yield for various semiconductors, including:
- Silicon carbide devices for EVs and charging infrastructure
- Gallium nitride devices for power conversion
- Silicon photonics devices for data centers and 5G infrastructure
- AI processors in wafer level and packaged part forms
Aehr Test Systems (NASDAQ:AEHR) ha annunciato la sua prossima presentazione virtuale al 27° Annual Needham Growth Conference che si terrà il 16 gennaio 2025, alle 15:00 ET. Il CEO Gayn Erickson e il CFO Chris Siu presenteranno e ospiteranno incontri con gli investitori durante tutta la giornata.
La società discuterà delle sue soluzioni di test a livello di wafer e di burn-in per i componenti confezionati per la produzione di semiconduttori, inclusa la recente acquisizione di Incal Technology e le nuove soluzioni di affidabilità per componenti ad alta potenza rivolte al mercato dei semiconduttori per AI.
Le soluzioni di Aehr si concentrano sul miglioramento della qualità, dell'affidabilità e del rendimento per vari semiconduttori, tra cui:
- Dispositivi in carburo di silicio per veicoli elettrici e infrastrutture di ricarica
- Dispositivi in nitruro di gallio per la conversione dell'energia
- Dispositivi in fotonica di silicio per centri dati e infrastrutture 5G
- Processori AI in forma di wafer e di componenti confezionati
Aehr Test Systems (NASDAQ:AEHR) anunció su próxima presentación virtual en la 27ª Conferencia Anual de Crecimiento de Needham que se llevará a cabo el 16 de enero de 2025, a las 3:00 p. m. ET. El CEO Gayn Erickson y el CFO Chris Siu presentarán y organizarán reuniones con inversores a lo largo del día.
La empresa discutirá sus soluciones de prueba a nivel de oblea y de burn-in para componentes empaquetados en la producción de semiconductores, incluida la reciente adquisición de Incal Technology y nuevas soluciones de fiabilidad para componentes de alta potencia dirigidas al mercado de semiconductores de IA.
Las soluciones de Aehr se centran en mejorar la calidad, fiabilidad y rendimiento de varios semiconductores, incluyendo:
- Dispositivos de carburo de silicio para vehículos eléctricos e infraestructura de carga
- Dispositivos de nitruro de galio para conversión de energía
- Dispositivos de fotónica de silicio para centros de datos e infraestructura 5G
- Procesadores de IA en forma de oblea y de componentes empaquetados
Aehr Test Systems (NASDAQ:AEHR)는 2025년 1월 16일 오후 3시 ET에 27회 연례 니드햄 성장 컨퍼런스에서 진행되는 가상 발표를 발표했습니다. CEO Gayn Erickson과 CFO Chris Siu는 하루 종일 투자자 회의를 진행하고 발표할 예정입니다.
회사는 최근 인칼 테크놀로지의 인수 및 AI 반도체 시장을 겨냥한 새로운 고전력 포장 부품 신뢰성 솔루션을 포함하여 반도체 생산을 위한 웨이퍼 수준 테스트 및 포장 부품 번인 솔루션에 대해 논의할 것입니다.
Aehr의 솔루션은 다음을 포함하여 다양한 반도체의 품질, 신뢰성 및 수율 향상에 초점을 맞추고 있습니다:
- 전기차 및 충전 인프라를 위한 실리콘 카바이드 장치
- 전력 변환을 위한 갈륨 나이트라이드 장치
- 데이터 센터 및 5G 인프라를 위한 실리콘 포토닉 장치
- 웨이퍼 수준 및 포장된 부품 형태의 AI 프로세서
Aehr Test Systems (NASDAQ:AEHR) a annoncé sa prochaine présentation virtuelle lors de la 27ème Conférence Annuelle de Croissance de Needham le 16 janvier 2025 à 15h00 ET. Le PDG Gayn Erickson et le directeur financier Chris Siu présenteront et organiseront des réunions avec les investisseurs tout au long de la journée.
L'entreprise discutera de ses solutions de test au niveau de la plaquette et de burn-in pour les composants emballés dans la production de semi-conducteurs, y compris sa récente acquisition d'Incal Technology et de nouvelles solutions de fiabilité pour les pièces haute puissance ciblant le marché des semi-conducteurs AI.
Les solutions d'Aehr se concentrent sur l'amélioration de la qualité, de la fiabilité et du rendement pour divers semi-conducteurs, y compris:
- Dispositifs en carbure de silicium pour véhicules électriques et infrastructures de recharge
- Dispositifs en nitrure de gallium pour la conversion d'énergie
- Dispositifs en photonique de silicium pour les centres de données et l'infrastructure 5G
- Processeurs AI sous forme de plaquettes et de composants emballés
Aehr Test Systems (NASDAQ:AEHR) kündigte seine bevorstehende virtuelle Präsentation auf der 27. jährlichen Needham Wachstumskonferenz am 16. Januar 2025 um 15:00 ET an. CEO Gayn Erickson und CFO Chris Siu werden präsentieren und den ganzen Tag über Investorenmeetings abhalten.
Das Unternehmen wird seine Wafer-Level-Test- und Burn-In-Lösungen für verpackte Teile in der Halbleiterproduktion diskutieren, einschließlich der jüngsten Übernahme von Incal Technology und neuen Hochleistungsverpackungen mit Zuverlässigkeitslösungen, die auf den AI-Halbleitermarkt abzielen.
Die Lösungen von Aehr konzentrieren sich darauf, die Qualität, Zuverlässigkeit und Ausbeute für verschiedene Halbleiter zu verbessern, einschließlich:
- Siliziumkarbidgeräte für Elektrofahrzeuge und Ladeinfrastruktur
- Gallium-Nitrid-Geräte für die Energieumwandlung
- Siliziumphotonikgeräte für Rechenzentren und 5G-Infrastruktur
- AI-Prozessoren in Wafer- und verpackten Teileformen
- None.
- None.
FREMONT, CA / ACCESSWIRE / January 14, 2025 / Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that CEO Gayn Erickson and CFO Chris Siu will be presenting virtually at the 27th Annual Needham Growth Conference on Thursday, January 16th at 3:00 pm ET (12:00 pm PT) and will be hosting virtual meetings with investors throughout the day.
You may register to access a live or replay video webcast of the presentation via a link posted to the investor relations section of Aehr's website at www.aehr.com or by clicking here.
"We look forward to discussing with investors and shareholders our innovative wafer level test and package part burn-in solutions for semiconductor production and the diverse markets they serve," said Mr. Erickson. "This includes our acquisition last July of Incal Technology and new high power packaged part reliability/burn-in test solutions that expand our addressable market within the rapidly growing artificial intelligence (AI) semiconductor market. Aehr Test provides complete turn-key solutions for improving quality, reliability, and yield of semiconductors. These include silicon carbide devices used in electric vehicles and charging infrastructure, gallium nitride devices for multiple power conversion applications, and silicon photonics devices used in data centers and 5G infrastructure and optical input/output (I/O) and co-packaged optics devices, as well as AI processors in both wafer level and packaged part device forms. The growing adoption of wafer level test and packaged part burn-in for these devices is a key growth driver for Aehr Test."
For additional information or to schedule a meeting with Aehr management, please contact your Needham representative or Aehr's investor relations firm, PondelWilkinson, Inc.,at jbyers@pondel.com.
About Aehr Test Systems
Headquartered in Fremont, California, Aehr Test Systems is a leading provider of test solutions for testing, burning-in, and stabilizing semiconductor devices in wafer level, singulated die, and package part form, and has installed thousands of systems worldwide. Increasing quality, reliability, safety, and security needs of semiconductors used across multiple applications, including electric vehicles, electric vehicle charging infrastructure, solar and wind power, computing, advanced AI processors, data and telecommunications infrastructure, and solid-state memory and storage, are driving additional test requirements, incremental capacity needs, and new opportunities for Aehr Test products and solutions. Aehr has developed and introduced several innovative products including the FOX-PTM families of test and burn-in systems and FOX WaferPakTM Aligner, FOX WaferPak Contactor, FOX DiePak® Carrier and FOX DiePak Loader. The FOX-XP and FOX-NP systems are full wafer contact and singulated die/module test and burn-in systems that can test, burn-in, and stabilize a wide range of devices such as leading-edge silicon carbide-based and other power semiconductors, 2D and 3D sensors used in mobile phones, tablets, and other computing devices, memory semiconductors, processors, microcontrollers, systems-on-a-chip, and photonics and integrated optical devices. The FOX-CP system is a low-cost single-wafer compact test solution for logic, memory and photonic devices and the newest addition to the FOX-P product family. The FOX WaferPak Contactor contains a unique full wafer contactor capable of testing wafers up to 300mm that enables IC manufacturers to perform test, burn-in, and stabilization of full wafers on the FOX-P systems. The FOX DiePak Carrier allows testing, burning in, and stabilization of singulated bare die and modules up to 1024 devices in parallel per DiePak on the FOX-NP and FOX-XP systems up to nine DiePaks at a time. Acquired through its acquisition of Incal Technology, Inc., Aehr's new line of high-power packaged part reliability/burn-in test solutions for Artificial Intelligence (AI) semiconductor manufacturers, including its ultra-high-power Sonoma family of test solutions for AI accelerators, GPUs, and high-performance computing (HPC) processors, position Aehr within the rapidly growing AI market as a turn-key provider of reliability and testing that span from engineering to high volume production. For more information, please visit Aehr Test Systems' website at www.aehr.com.
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Contacts:
Aehr Test Systems
Chris Siu
Chief Financial Officer
csiu@aehr.com
PondelWilkinson, Inc.
Todd Kehrli or Jim Byers
Analyst/Investor Contact
tkehrli@pondel.com
jbyers@pondel.com
SOURCE: Aehr Test Systems
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