Mitsubishi Electric to Launch Contact Image Sensor in New KD-CXF Series
Achieves industry's deepest depth of field; ideal for inspecting surfaces of diverse objects in production
Until now, the limitation of a shallow depth of field has made it difficult for CIS units to clearly focus on and accurately inspect objects that have significant surface irregularities or if they are subjected to strong vibration while moving down a production line. The company’s existing CIS models are only used to inspect objects with flat surfaces, such as paper and film, and objects not subjected to vibration during inspection.
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