Keysight Introduces New Method to Accelerate Power Amplifier Digital Pre-Distortion Test Speeds
Keysight Technologies (NYSE: KEYS) has introduced a new Iterative Learning Control (ILC) test method that significantly reduces Digital Pre-Distortion (DPD) test times for power amplifiers from hours to minutes. This innovation supports power amplifier manufacturers in accelerating their R&D cycles and reducing time-to-market. The technique was first deployed by Hexawave to validate its HWA1330 gallium arsenide amplifier, achieving impressive metrics such as over 30% power added efficiency (PAE) and a power gain of 35.5 dB. Keysight's ILC method forms part of its High Frequency Measurement Solution portfolio, enhancing measurement accuracy and performance.
- Introduction of the ILC test method reduces DPD test times from hours to minutes.
- Supports faster R&D cycles for power amplifier manufacturers, improving time-to-market.
- Hexawave has successfully deployed the ILC method to validate its HWA1330 amplifier.
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- New Iterative Learning Control algorithm shortens Digital Pre-Distortion test times for power amplifiers from hours to minutes
- Test method allows power amplifier manufacturers to shorten R&D cycles and speed up time-to-market
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Hexawave, an
Ennostar Group affiliate, first to deploy new test method to characterize high-efficiency broadband gallium arsenide power amplifier
Power amplifiers (PA) are a core component in wireless communication devices. Characterization of these components is a critical but time-consuming task that can take hours or even days during the research & development (R&D) phase. By shortening the time it takes to complete the design and validation process, power amplifier manufacturers are able to accelerate their time-to-market.
Keysight meets this need by introducing the innovative ILC DPD test method that shortens DPD test time to minutes and accelerates R&D time from test validation to product design and optimization. As a part of Keysight’s comprehensive High Frequency Measurement Solution portfolio, the ILC test method runs on the N9055EM0E Power Amplifier Measurement Application and uses the VXG Vector Signal Generator and PXA Signal Analyzer to provide industry-leading test performance for signal generation and analysis.
The ILC DPD test method offers the following benefits:
- Faster Test Speeds – Optimizes the N9055EM0E software to reduce the characterization of power amplifiers to minutes.
- Integrated User Interface – Shows both pre-DPD and post-DPD measurement results in one screen for easier operation and integration when characterizing a power amplifier with multiple test instruments.
- Measurement Accuracy and Performance – Provides industry-leading performance when characterizing power amplifier by removing the limitations of signal analyzer and generator and determining the real-world performance of power amplifier designs.
Fabless semiconductor manufacturer Hexawave is the first to deploy the ILC test method to characterize its new HWA1330 5G gallium arsenide (GaAs) PA up to 4 watts in the 3.3 to 3.8 GHz frequency range. The ILC test method was critical in validating that the HWA1330 can meet design targets including more than
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Resources
- Application Note: Iterative Learning Control
- N9055EM0E Power Amplifier Measurement Application
- VXG Vector Signal Generator
- PXA Signal Analyzer
About
At Keysight (NYSE: KEYS), we inspire and empower innovators to bring world-changing technologies to life. As an S&P 500 company, we’re delivering market-leading design, emulation, and test solutions to help engineers develop and deploy faster, with less risk, throughout the entire product lifecycle. We’re a global innovation partner enabling customers in communications, industrial automation, aerospace and defense, automotive, semiconductor, and general electronics markets to accelerate innovation to connect and secure the world. Learn more at Keysight Newsroom and www.keysight.com.
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