Aehr Test Systems to Present at The LD Micro Main Event XVII Investor Conference in Los Angeles on October 29, 2024
Aehr Test Systems (NASDAQ: AEHR), a global supplier of semiconductor test and burn-in equipment, announced its participation in the 17th annual LD Micro Main Event Conference. President and CEO Gayn Erickson will present on October 29, 2024, at 2:30 pm PT at the Luxe Sunset Boulevard Hotel in Los Angeles.
Erickson will discuss Aehr's wafer level test and package part burn-in solutions for semiconductor production, including their recent acquisition of Incal Technology and new high power packaged part reliability/burn-in test solutions. These innovations expand Aehr's addressable market within the rapidly growing artificial intelligence (AI) semiconductor market.
Aehr Test provides solutions for improving quality, reliability, and yield of semiconductors such as silicon carbide devices for electric vehicles, gallium nitride devices for power conversion, and silicon photonics devices for data centers and 5G infrastructure. The adoption of these technologies is a significant growth driver for Aehr Test.
Aehr Test Systems (NASDAQ: AEHR), fornitore globale di apparecchiature per test e burn-in dei semiconduttori, ha annunciato la sua partecipazione alla 17esima edizione della LD Micro Main Event Conference. Il presidente e CEO Gayn Erickson presenterà il 29 ottobre 2024, alle 14:30 PT presso l'hotel Luxe Sunset Boulevard a Los Angeles.
Erickson discuterà delle soluzioni di test a livello wafer e burn-in per i componenti impacchettati di Aehr per la produzione di semiconduttori, inclusa la recente acquisizione di Incal Technology e le nuove soluzioni di test di affidabilità/burn-in per componenti impacchettati ad alta potenza. Queste innovazioni espandono il mercato addressabile di Aehr nel mercato dei semiconduttori per intelligenza artificiale (AI) in rapida crescita.
Aehr Test fornisce soluzioni per migliorare la qualità, l'affidabilità e il rendimento dei semiconduttori come i dispositivi in carburo di silicio per veicoli elettrici, i dispositivi in nitruro di gallio per la conversione di potenza e i dispositivi in fotonica silicio per i data center e le infrastrutture 5G. L'adozione di queste tecnologie rappresenta un importante motore di crescita per Aehr Test.
Aehr Test Systems (NASDAQ: AEHR), proveedor global de equipos de prueba y burn-in para semiconductores, anunció su participación en la 17ª Conferencia Anual LD Micro Main Event. El presidente y CEO Gayn Erickson presentará el 29 de octubre de 2024, a las 2:30 pm PT en el Luxe Sunset Boulevard Hotel de Los Ángeles.
Erickson discutirá las soluciones de prueba a nivel de oblea y de burn-in para componentes empaquetados de Aehr para la producción de semiconductores, incluida la reciente adquisición de Incal Technology y nuevas soluciones de prueba de confiabilidad/burn-in para componentes empaquetados de alta potencia. Estas innovaciones expanden el mercado direccionable de Aehr dentro del rápidamente creciente mercado de semiconductores de inteligencia artificial (AI).
Aehr Test proporciona soluciones para mejorar la calidad, confiabilidad y rendimiento de semiconductores, como dispositivos de carburo de silicio para vehículos eléctricos, dispositivos de nitruro de galio para conversión de energía y dispositivos de fotónica de silicio para centros de datos e infraestructura 5G. La adopción de estas tecnologías es un importante motor de crecimiento para Aehr Test.
Aehr Test Systems (NASDAQ: AEHR)는 반도체 테스트 및 번인 장비의 글로벌 공급업체로서 제17회 LD Micro Main Event Conference에 참가한다고 발표했습니다. 회장 겸 CEO인 Gayn Erickson은 2024년 10월 29일, 오후 2:30 PT에 로스앤젤레스의 Luxe Sunset Boulevard Hotel에서 발표할 예정입니다.
Erickson은 반도체 생산을 위한 Aehr의 웨이퍼 수준 테스트 및 패키지 부품 번인 솔루션에 대해 논의할 것이며, 최근 Incal Technology를 인수한 것과 고출력 패키지 부품 신뢰성/번인 테스트 솔루션에 대해 다룰 예정입니다. 이러한 혁신은 급성장하는 인공지능(AI) 반도체 시장 내에서 Aehr의 가능 시장을 확대합니다.
Aehr Test는 전기차용 실리콘 카바이드 장치, 전력 변환을 위한 갈륨 나이트라이드 장치, 데이터 센터 및 5G 인프라를 위한 실리콘 포토닉스 장치와 같은 반도체의 품질, 신뢰성 및 수율을 향상시키는 솔루션을 제공합니다. 이러한 기술의 채택은 Aehr Test의 중요한 성장 동력입니다.
Aehr Test Systems (NASDAQ: AEHR), un fournisseur mondial d'équipements de test et de burn-in pour semi-conducteurs, a annoncé sa participation à la 17e conférence annuelle LD Micro Main Event. Le Président et CEO Gayn Erickson présentera le 29 octobre 2024, à 14h30 PT à l'hôtel Luxe Sunset Boulevard à Los Angeles.
Erickson discutera des solutions de test de niveau wafer et de burn-in pour les composants encapsulés d'Aehr pour la production de semi-conducteurs, y compris leur récente acquisition d'Incal Technology et de nouvelles solutions de test de fiabilité/burn-in pour les composants encapsulés à haute puissance. Ces innovations élargissent le marché adressable d'Aehr dans le marché des semi-conducteurs pour l'intelligence artificielle (IA) en rapide croissance.
Aehr Test fournit des solutions pour améliorer la qualité, la fiabilité et le rendement des semi-conducteurs tels que les dispositifs en carbure de silicium pour véhicules électriques, les dispositifs en nitrure de gallium pour la conversion d'énergie et les dispositifs en photonique silicon pour les centres de données et l'infrastructure 5G. L'adoption de ces technologies est un moteur de croissance significatif pour Aehr Test.
Aehr Test Systems (NASDAQ: AEHR), ein globaler Anbieter von Test- und Burn-In-Ausrüstung für Halbleiter, kündigte seine Teilnahme an der 17. jährlichen LD Micro Main Event Conference an. Präsident und CEO Gayn Erickson wird am 29. Oktober 2024 um 14:30 Uhr PT im Luxe Sunset Boulevard Hotel in Los Angeles präsentieren.
Erickson wird über Aehrs Wafer-Level-Test- und Burn-In-Lösungen für verpackte Bauteile zur Halbleiterproduktion diskutieren, einschließlich der kürzlichen Übernahme von Incal Technology und neuen Hochleistungs-Testlösungen für Zuverlässigkeit/Burn-In von verpackten Bauteilen. Diese Innovationen erweitern Aehrs adressierbaren Markt im schnell wachsenden Markt für Halbleiter der künstlichen Intelligenz (AI).
Aehr Test bietet Lösungen zur Verbesserung der Qualität, Zuverlässigkeit und Ausbeute von Halbleitern wie Siliziumkarbid-Geräten für Elektrofahrzeuge, Gallium-Nitrid-Geräten für die Energieumwandlung und Silizium-Photonik-Geräten für Rechenzentren und 5G-Infrastruktur. Die Einführung dieser Technologien ist ein bedeutender Wachstumstreiber für Aehr Test.
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Fremont, California--(Newsfile Corp. - October 21, 2024) - Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that President and CEO Gayn Erickson will be presenting at the 17th annual LD Micro Main Event Conference on Tuesday, October 29, 2024 at 2:30 pm PT at the Luxe Sunset Boulevard Hotel in Los Angeles, and will be meeting with investors throughout the day. You may register to watch the presentation here.
"I look forward to discussing with investors and shareholders our unique wafer level test and package part burn-in solutions for semiconductor production and the markets they serve, including our recent acquisition of Incal Technology and new high power packaged part reliability/burn-in test solutions that expand our addressable market within the rapidly growing artificial intelligence (AI) semiconductor market," said Mr. Erickson. "Aehr Test provides complete turn-key solutions for improving quality, reliability, and yield of semiconductors such as silicon carbide devices used in electric vehicles and charging infrastructure, gallium nitride devices for multiple power conversion applications, and silicon photonics devices used in data centers and 5G infrastructure and optical input/output (I/O) and co-packaged optics devices as well as AI processors in both wafer level and packaged part device forms. The adoption of wafer level test and packaged parts burn-in of these devices is a significant growth driver for Aehr Test."
The 2024 LD Micro Main Event XVII will be held at the Luxe Sunset Boulevard Hotel in Los Angeles from October 28th to the 30th, and will host 150 companies for two days of presentations and one-on-one investor meetings.
About LD Micro
LD Micro aims to be the most essential resource in the micro-cap world. Whether it is the Index, comprehensive data, or hosting the most significant events annually, LD's sole mission is to serve as an invaluable asset for all those interested in finding the next generation of great companies. To learn more about LD Micro, visit http://www.ldmicro.com.
About Aehr Test Systems
Headquartered in Fremont, California, Aehr Test Systems is a leading provider of test solutions for testing, burning-in, and stabilizing semiconductor devices in wafer level, singulated die, and package part form, and has installed thousands of systems worldwide. Increasing quality, reliability, safety, and security needs of semiconductors used across multiple applications, including electric vehicles, electric vehicle charging infrastructure, solar and wind power, computing, data and telecommunications infrastructure, and solid-state memory and storage, are driving additional test requirements, incremental capacity needs, and new opportunities for Aehr Test products and solutions. Aehr has developed and introduced several innovative products including the FOX-PTM families of test and burn-in systems and FOX WaferPakTM Aligner, FOX WaferPak Contactor, FOX DiePak® Carrier and FOX DiePak Loader. The FOX-XP and FOX-NP systems are full wafer contact and singulated die/module test and burn-in systems that can test, burn-in, and stabilize a wide range of devices such as leading-edge silicon carbide-based and other power semiconductors, 2D and 3D sensors used in mobile phones, tablets, and other computing devices, memory semiconductors, processors, microcontrollers, systems-on-a-chip, and photonics and integrated optical devices. The FOX-CP system is a low-cost single-wafer compact test solution for logic, memory and photonic devices and the newest addition to the FOX-P product family. The FOX WaferPak Contactor contains a unique full wafer contactor capable of testing wafers up to 300mm that enables IC manufacturers to perform test, burn-in, and stabilization of full wafers on the FOX-P systems. The FOX DiePak Carrier allows testing, burning in, and stabilization of singulated bare die and modules up to 1024 devices in parallel per DiePak on the FOX-NP and FOX-XP systems up to nine DiePaks at a time. Acquired through its acquisition of Incal Technology, Inc., Aehr's new line of high-power packaged part reliability/burn-in test solutions for Artificial Intelligence (AI) semiconductor manufacturers, including its ultra-high-power Sonoma family of test solutions for AI accelerators, GPUs, and high-performance computing (HPC) processors, position Aehr within the rapidly growing AI market as a turn-key provider of reliability and testing that span from engineering to high volume production. For more information, please visit Aehr Test Systems' website at www.aehr.com.
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Contacts:
Aehr Test Systems
Chris Siu
Chief Financial Officer
csiu@aehr.com
MKR Investor Relations Inc.
Todd Kehrli or Jim Byers
Analyst/Investor Contact
(323) 468-2300
aehr@mkr-group.com
To view the source version of this press release, please visit https://www.newsfilecorp.com/release/227355
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