Aehr Test Systems to Participate in 13th Annual NYC Summit
Aehr Test Systems (NASDAQ:AEHR) announced its participation in the 13th Annual NYC Summit investor conference on December 17th at Mastro's New York. CEO Gayn Erickson will discuss their wafer level test and package part burn-in solutions for semiconductor production, including their recent acquisition of Incal Technology and new solutions for the AI semiconductor market.
The company provides solutions for improving quality, reliability, and yield of semiconductors, including:
- Silicon carbide devices for EVs and charging infrastructure
- Gallium nitride devices for power conversion
- Silicon photonics devices for data centers and 5G infrastructure
- AI processors in wafer level and packaged part forms
Aehr Test Systems (NASDAQ:AEHR) ha annunciato la sua partecipazione al 13° Annual NYC Summit, un conferenza per investitori che si terrà il 17 dicembre presso Mastro's New York. Il CEO Gayn Erickson discuterà delle loro soluzioni di test a livello di wafer e bruciatura dei componenti imballati per la produzione di semiconduttori, inclusa la recente acquisizione di Incal Technology e le nuove soluzioni per il mercato dei semiconduttori AI.
L'azienda fornisce soluzioni per migliorare la qualità, l'affidabilità e il rendimento dei semiconduttori, tra cui:
- Dispositivi in carburo di silicio per veicoli elettrici e infrastrutture di ricarica
- Dispositivi in nitruro di gallio per la conversione di potenza
- Dispositivi in fotonica siliconica per data center e infrastrutture 5G
- Processori AI in forma di wafer e componenti imballati
Aehr Test Systems (NASDAQ:AEHR) anunció su participación en la 13ª Cumbre Anual NYC Summit, una conferencia para inversores que se llevará a cabo el 17 de diciembre en Mastro's New York. El CEO Gayn Erickson discutirá sus soluciones de prueba a nivel de oblea y de quemado de piezas empaquetadas para la producción de semiconductores, incluida la reciente adquisición de Incal Technology y nuevas soluciones para el mercado de semiconductores de IA.
La empresa proporciona soluciones para mejorar la calidad, fiabilidad y rendimiento de los semiconductores, incluyendo:
- Dispositivos de carburo de silicio para vehículos eléctricos e infraestructura de carga
- Dispositivos de nitruro de galio para conversión de potencia
- Dispositivos de fotónica de silicio para centros de datos e infraestructura 5G
- Procesadores de IA en formas de oblea y piezas empaquetadas
Aehr Test Systems (NASDAQ:AEHR)는 12월 17일 Mastro's New York에서 열리는 제13회 NYC Summit 투자자 회의에 참여한다고 발표했습니다. CEO Gayn Erickson은 반도체 생산을 위한 웨이퍼 수준 테스트 및 패키지 부품 번인 솔루션에 대해 논의할 예정이며, Incal Technology의 최근 인수 및 AI 반도체 시장을 위한 새로운 솔루션도 소개할 것입니다.
회사는 반도체의 품질, 신뢰성 및 수율을 개선하기 위한 솔루션을 제공하며, 다음과 같은 제품이 포함됩니다:
- 전기차 및 충전 인프라를 위한 실리콘 카바이드 장치
- 전력 변환을 위한 질화 갈륨 장치
- 데이터 센터 및 5G 인프라를 위한 실리콘 포토닉스 장치
- 웨이퍼 수준 및 패키지 부품 형태의 AI 프로세서
Aehr Test Systems (NASDAQ:AEHR) a annoncé sa participation à la 13ème conférence annuelle des investisseurs NYC Summit, qui se tiendra le 17 décembre au Mastro's New York. Le PDG Gayn Erickson discutera de leurs solutions de test de niveau wafer et de brûlage des composants emballés pour la production de semi-conducteurs, y compris leur récente acquisition d'Incal Technology et de nouvelles solutions pour le marché des semi-conducteurs IA.
L'entreprise fournit des solutions pour améliorer la qualité, la fiabilité et le rendement des semi-conducteurs, y compris:
- Des dispositifs en carbure de silicium pour les véhicules électriques et l'infrastructure de recharge
- Des dispositifs en nitrure de gallium pour la conversion de puissance
- Des dispositifs en photonique silicium pour les centres de données et l'infrastructure 5G
- Des processeurs IA sous forme de wafer et de composants emballés
Aehr Test Systems (NASDAQ:AEHR) gab seine Teilnahme an der 13. jährlichen NYC Summit-Investorenkonferenz bekannt, die am 17. Dezember im Mastro's New York stattfindet. CEO Gayn Erickson wird über ihre Wafer-Level-Test- und Paketteil-Burn-In-Lösungen für die Halbleiterproduktion sprechen, einschließlich der kürzlichen Übernahme von Incal Technology und neuen Lösungen für den AI-Halbleitermarkt.
Das Unternehmen bietet Lösungen zur Verbesserung der Qualität, Zuverlässigkeit und Ausbeute von Halbleitern an, darunter:
- Siliziumkarbidgeräte für Elektrofahrzeuge und Ladeinfrastruktur
- Gallium-Nitridgeräte für die Leistungsverwandlung
- Siliziumphotonikgeräte für Rechenzentren und 5G-Infrastruktur
- AI-Prozessoren in Wafer-Level- und verpackten Bauteilen
- None.
- None.
FREMONT, CA / ACCESSWIRE / December 9, 2024 / Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that President and CEO Gayn Erickson will be participating in the 13th Annual NYC Summit investor conference being held Tuesday, December 17th at Mastro's New York.
"I once again look forward to discussing with investors and shareholders our unique wafer level test and package part burn-in solutions for semiconductor production and the markets they serve, including our acquisition last July of Incal Technology and new high power packaged part reliability/burn-in test solutions that expand our addressable market within the rapidly growing artificial intelligence (AI) semiconductor market," said Mr. Erickson. "Aehr Test provides complete turn-key solutions for improving quality, reliability, and yield of semiconductors such as silicon carbide devices used in electric vehicles and charging infrastructure, gallium nitride devices for multiple power conversion applications, and silicon photonics devices used in data centers and 5G infrastructure and optical input/output (I/O) and co-packaged optics devices as well as AI processors in both wafer level and packaged part device forms. The adoption of wafer level test and packaged parts burn-in of these devices is a significant growth driver for Aehr Test."
The presentation material utilized by Aehr Test at the NYC Summit will be made available on the investor relations page of the Company's website at www.aehr.com.
About the 13th Annual NYC Summit
The NYC Summit is collectively hosted and funded by participating companies and features a "round-robin" format consisting of small group meetings with company management teams. During the event, investors and analysts will have the opportunity to meet with the majority of the 18 management teams during the small group meeting sessions, as well as opportunities to meet with management during the breakfast and lunch networking sessions.
Attendance at the NYC Summit is by invitation only and is available solely to accredited investors and publishing research analysts. As space is limited, please RSVP early. Hosts reserve the right to limit attendance as necessary. Last day for registration is December 10, 2024.
RSVP Contacts for 13th Annual NYC Summit 2024
To RSVP for the NYC Summit, please contact either of the Summit's co-chairs:
Laura J. Guerrant-Oiye
Phone: (808) 960-2642
Email: lauraoiye@gmail.com
Claire E. McAdams
Phone: (530) 265-9899
Email: claire@headgatepartners.com
About Aehr Test Systems
Headquartered in Fremont, California, Aehr Test Systems is a leading provider of test solutions for testing, burning-in, and stabilizing semiconductor devices in wafer level, singulated die, and package part form, and has installed thousands of systems worldwide. Increasing quality, reliability, safety, and security needs of semiconductors used across multiple applications, including electric vehicles, electric vehicle charging infrastructure, solar and wind power, computing, data and telecommunications infrastructure, and solid-state memory and storage, are driving additional test requirements, incremental capacity needs, and new opportunities for Aehr Test products and solutions. Aehr has developed and introduced several innovative products including the FOX-PTM families of test and burn-in systems and FOX WaferPakTM Aligner, FOX WaferPak Contactor, FOX DiePak® Carrier and FOX DiePak Loader. The FOX-XP and FOX-NP systems are full wafer contact and singulated die/module test and burn-in systems that can test, burn-in, and stabilize a wide range of devices such as leading-edge silicon carbide-based and other power semiconductors, 2D and 3D sensors used in mobile phones, tablets, and other computing devices, memory semiconductors, processors, microcontrollers, systems-on-a-chip, and photonics and integrated optical devices. The FOX-CP system is a low-cost single-wafer compact test solution for logic, memory and photonic devices and the newest addition to the FOX-P product family. The FOX WaferPak Contactor contains a unique full wafer contactor capable of testing wafers up to 300mm that enables IC manufacturers to perform test, burn-in, and stabilization of full wafers on the FOX-P systems. The FOX DiePak Carrier allows testing, burning in, and stabilization of singulated bare die and modules up to 1024 devices in parallel per DiePak on the FOX-NP and FOX-XP systems up to nine DiePaks at a time. Acquired through its acquisition of Incal Technology, Inc., Aehr's new line of high-power packaged part reliability/burn-in test solutions for Artificial Intelligence (AI) semiconductor manufacturers, including its ultra-high-power Sonoma family of test solutions for AI accelerators, GPUs, and high-performance computing (HPC) processors, position Aehr within the rapidly growing AI market as a turn-key provider of reliability and testing that span from engineering to high volume production. For more information, please visit Aehr Test Systems' website at www.aehr.com.
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SOURCE: Aehr Test Systems
View the original press release on accesswire.com
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