Aehr Test Systems Reschedules Second Quarter Fiscal 2025 Financial Results Conference Call to Monday, January 13, 2025 in Recognition of National Day of Mourning in Honor of Former President Jimmy Carter
Aehr Test Systems (NASDAQ:AEHR) has rescheduled its second quarter fiscal 2025 financial results conference call from Thursday, January 9, 2025, to Monday, January 13, 2025, after market close. The rescheduling is due to the National Day of Mourning in honor of former President Jimmy Carter, during which US stock markets will be closed. The conference call will be held at 5:00 p.m. Eastern time (2:00 p.m. PT), with both dial-in and webcast options available for participants.
Aehr Test Systems (NASDAQ:AEHR) ha riprogrammato la conferenza telefonica sui risultati finanziari del secondo trimestre dell'anno fiscale 2025, originariamente prevista per giovedì 9 gennaio 2025, a lunedì 13 gennaio 2025, dopo la chiusura del mercato. Il cambio di programma è dovuto al Giorno Nazionale di Lutto in onore dell'ex Presidente Jimmy Carter, durante il quale i mercati azionari statunitensi saranno chiusi. La conferenza telefonica si terrà alle 17:00 ora orientale (14:00 ora del Pacifico), con opzioni di accesso sia tramite telefono che in streaming disponibili per i partecipanti.
Aehr Test Systems (NASDAQ:AEHR) ha reprogramado su conferencia telefónica de resultados financieros del segundo trimestre del año fiscal 2025, que estaba prevista para el jueves 9 de enero de 2025, para el lunes 13 de enero de 2025, después del cierre del mercado. Este cambio se debe al Día Nacional de Luto en honor al expresidente Jimmy Carter, durante el cual los mercados bursátiles de EE. UU. estarán cerrados. La conferencia telefónica se llevará a cabo a las 5:00 p.m. hora del este (2:00 p.m. PT), con opciones de acceso tanto por línea directa como por webcast disponibles para los participantes.
Aehr Test Systems (NASDAQ:AEHR)는 2025 회계연도 2분기 재무 결과에 대한 전화 회의를 2025년 1월 9일 목요일에서 2025년 1월 13일 월요일으로 재조정했습니다. 이 재조정은 전 대통령 지미 카터를 기리기 위한 국가 애도일로 인해 이루어졌으며, 이 기간 동안 미국 주식 시장은 휴장합니다. 전화 회의는 동부 표준시 기준 오후 5시 (태평양 표준시 기준 오후 2시)에 개최되며, 참가자에 대해 전화 접속 및 웹캐스트 옵션이 제공됩니다.
Aehr Test Systems (NASDAQ:AEHR) a reprogrammé sa conférence téléphonique sur les résultats financiers du deuxième trimestre de l'année fiscale 2025, initialement prévue pour le jeudi 9 janvier 2025, au lundi 13 janvier 2025, après la fermeture du marché. Ce changement est dû au Jour National de Deuil en hommage à l'ancien président Jimmy Carter, durant lequel les marchés boursiers américains seront fermés. La conférence téléphonique aura lieu à 17h00, heure de l'Est (14h00, heure du Pacifique), avec des options de participation par téléphone et par webcast disponibles pour les participants.
Aehr Test Systems (NASDAQ:AEHR) hat die Telefonkonferenz zu den Finanzergebnissen für das zweite Quartal des Geschäftsjahres 2025 vom Donnerstag, den 9. Januar 2025, auf Montag, den 13. Januar 2025, nach Marktschluss verlegt. Die Neuplanung erfolgt aufgrund des Nationalen Trauertages zu Ehren des ehemaligen Präsidenten Jimmy Carter, an dem die US-Börsen geschlossen sind. Die Telefonkonferenz findet um 17:00 Uhr Eastern Time (14:00 Uhr PT) statt, dabei stehen sowohl Telefon- als auch Webcast-Optionen für die Teilnehmer zur Verfügung.
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FREMONT, CA / ACCESSWIRE / December 31, 2024 / Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced it has moved its second quarter fiscal 2025 earnings release and conference call, previously scheduled for Thursday, January 9, 2025, to Monday, January 13, 2025 following the close of the market. The Company will host a conference call and webcast at 5:00 p.m. Eastern time to discuss the results. The change to the earnings release and conference call date is in recognition of the National Day of Mourning in honor of former President Jimmy Carter and the closing of the US stock markets on January 9, 2025.
What: Aehr Test Systems second quarter fiscal 2025 financial results conference call.
When: Monday, January 13, at 5:00 p.m. Eastern Time (2:00 p.m. PT).
Dial in Number: To access the live call, dial +1 888-506-0062 (US and Canada) or +1 973-528-0011 (International) and give the participant passcode 747530.
Webcast: To access the live webcast, please visit the investor relations section at www.aehr.com.
Call Replay: A phone replay of the call will be available approximately two hours following the end of the live call and will remain available for one week. To access the call replay, dial +1 877-481-4010 (US and Canada) or +1 919-882-2331 (International) and enter replay passcode 51776.
About Aehr Test Systems
Headquartered in Fremont, California, Aehr Test Systems is a leading provider of test solutions for testing, burning-in, and stabilizing semiconductor devices in wafer level, singulated die, and package part form, and has installed thousands of systems worldwide. Increasing quality, reliability, safety, and security needs of semiconductors used across multiple applications, including electric vehicles, electric vehicle charging infrastructure, solar and wind power, computing, data and telecommunications infrastructure, and solid-state memory and storage, are driving additional test requirements, incremental capacity needs, and new opportunities for Aehr Test products and solutions. Aehr has developed and introduced several innovative products including the FOX-PTM families of test and burn-in systems and FOX WaferPakTM Aligner, FOX WaferPak Contactor, FOX DiePak® Carrier and FOX DiePak Loader. The FOX-XP and FOX-NP systems are full wafer contact and singulated die/module test and burn-in systems that can test, burn-in, and stabilize a wide range of devices such as leading-edge silicon carbide-based and other power semiconductors, 2D and 3D sensors used in mobile phones, tablets, and other computing devices, memory semiconductors, processors, microcontrollers, systems-on-a-chip, and photonics and integrated optical devices. The FOX-CP system is a low-cost single-wafer compact test solution for logic, memory and photonic devices and the newest addition to the FOX-P product family. The FOX WaferPak Contactor contains a unique full wafer contactor capable of testing wafers up to 300mm that enables IC manufacturers to perform test, burn-in, and stabilization of full wafers on the FOX-P systems. The FOX DiePak Carrier allows testing, burning in, and stabilization of singulated bare die and modules up to 1024 devices in parallel per DiePak on the FOX-NP and FOX-XP systems up to nine DiePaks at a time. Acquired through its acquisition of Incal Technology, Inc., Aehr's new line of high-power packaged part reliability/burn-in test solutions for Artificial Intelligence (AI) semiconductor manufacturers, including its ultra-high-power Sonoma family of test solutions for AI accelerators, GPUs, and high-performance computing (HPC) processors, position Aehr within the rapidly growing AI market as a turn-key provider of reliability and testing that span from engineering to high volume production. For more information, please visit Aehr Test Systems' website at www.aehr.com.
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Contacts:
Aehr Test Systems |
| MKR Investor Relations Inc. |
SOURCE: Aehr Test Systems
View the original press release on accesswire.com
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