Aehr Test Systems to Participate in Craig-Hallum Institutional Investor Virtual Conference on June 2, 2021

Rhea-AI Summary

Aehr Test Systems (NASDAQ: AEHR) announced participation in the 18th Annual Craig-Hallum Institutional Investor Virtual Conference on June 2, 2021. The company’s President and CEO, Gayn Erickson, and CFO, Ken Spink, will host virtual meetings with investors.

Erickson stated the focus will be on their semiconductor testing solutions, which are vital for enhancing yield and reliability in markets like electric vehicles, data centers, and wearable tech. Aehr Test provides various innovative testing systems, including the ABTS and FOX families, designed for various semiconductor applications.

FREMONT, Calif., May 28, 2021 (GLOBE NEWSWIRE) -- Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of semiconductor test and reliability qualification equipment, today announced that it will participate in the 18^th Annual Craig-Hallum Institutional Investor Virtual Conference on Wednesday, June 2, 2021. Aehr Test President and CEO Gayn Erickson and CFO Ken Spink will be hosting virtual meetings with investors throughout the day.

“We look forward to discussing our semiconductor wafer level and singulated die test and burn-in solutions and the markets they serve with investors,” said Mr. Erickson. “Aehr Test provides complete production solutions for improving yield and reliability of semiconductors, and devices such as silicon carbide semiconductors used in electric and hybrid electric vehicles, silicon photonics devices used in data centers and 5G infrastructure, and 2D/3D and other sensors used in mobile and wearable applications, which are expected to be significant revenue drivers for our products.”

For additional information, or to schedule a virtual meeting with Aehr management, please contact your Craig-Hallum representative, or Aehr’s investor relations firm, MKR Investor Relations, at aehr@mkr-group.com.

About Aehr Test Systems
Headquartered in Fremont, California, Aehr Test Systems is a worldwide provider of test systems for burning-in and testing logic, optical and memory integrated circuits and has installed over 2,500 systems worldwide. Increased quality and reliability needs of the Automotive and Mobility integrated circuit markets are driving additional test requirements, incremental capacity needs, and new opportunities for Aehr Test products in package, wafer level, and singulated die/module level test. Aehr Test has developed and introduced several innovative products, including the ABTS^TM and FOX-P^TM families of test and burn-in systems and FOX WaferPak^TM Aligner, FOX-XP WaferPak Contactor, FOX DiePak^® Carrier and FOX DiePak Loader. The ABTS system is used in production and qualification testing of packaged parts for both lower power and higher power logic devices as well as all common types of memory devices. The FOX-XP and FOX-NP systems are full wafer contact and singulated die/module test and burn-in systems used for burn-in and functional test of complex devices, such as leading-edge memories, digital signal processors, microprocessors, microcontrollers, systems-on-a-chip, and integrated optical devices. The FOX-CP system is a new low-cost single-wafer compact test and reliability verification solution for logic, memory and photonic devices and the newest addition to the FOX-P product family. The WaferPak contactor contains a unique full wafer probe card capable of testing wafers up to 300mm that enables IC manufacturers to perform test and burn-in of full wafers on Aehr Test FOX systems. The DiePak Carrier is a reusable, temporary package that enables IC manufacturers to perform cost-effective final test and burn-in of both bare die and modules. For more information, please visit Aehr Test Systems’ website at www.aehr.com.

Contacts:
Aehr Test Systems	MKR Investor Relations Inc.
Ken Spink	Todd Kehrli or Jim Byers
Chief Financial Officer	Analyst/Investor Contact
(510) 623-9400 x309	(323) 468-2300
	aehr@mkr-group.com

FAQ

When is Aehr Test Systems participating in the Craig-Hallum conference?

Aehr Test Systems will participate in the Craig-Hallum Institutional Investor Virtual Conference on June 2, 2021.

Who will represent Aehr Test Systems at the conference?

Gayn Erickson, President and CEO, and Ken Spink, CFO, will represent Aehr Test Systems at the conference.

What topics will Aehr Test discuss at the Craig-Hallum conference?

Aehr Test will discuss its semiconductor wafer level and singulated die test and burn-in solutions.

What markets does Aehr Test Systems focus on?

Aehr Test focuses on markets such as electric vehicles, data centers, and wearable technologies.

What innovative products does Aehr Test Systems offer?

Aehr Test offers several innovative products, including the ABTS and FOX families of test and burn-in systems.