NI Introduces Patented, Time-saving EVM Measurement Technique
NI (Nasdaq: NATI) has unveiled a fast convergence cross-correlation measurement technique that enhances error vector magnitude (EVM) performance in Wireless LAN (WLAN) signals. This patented technology boosts accuracy and measurement speed, allowing WLAN manufacturers to meet new WiFi7 standards efficiently. The method reduces measurement times by up to 100x compared to traditional approaches, facilitating quicker market readiness. NI aims to support clients in achieving superior RF performance while optimizing test times and manufacturing yields.
- Introduced patented technology improving measurement accuracy and speed for WLAN signals.
- Significantly reduces time for EVM measurements, enhancing product characterization by up to 100x.
- Enables WLAN device manufacturers to comply with stringent WiFi7 standards, facilitating faster time to market.
- Expanded flexibility and scalability of software-centric PXI automated test systems.
- None.
New Technique Utilizes Fast Convergence Cross-Correlation to Improve Measurement Speed and Accuracy
The evolution of the WiFi7 or IEEE 802.11be standard offers consumers dramatic improvements in data throughput through wider channel bandwidths, improved spectrum efficiency and higher-order modulation schemes like 4096-QAM. WiFi7 also introduces new technical requirements to WLAN device manufacturers and requires WLAN systems and components to achieve more stringent RF performance requirements.
One of the most challenging RF performance measurements of new WiFi7 designs is the EVM measurement over wide RF bandwidth. To address this challenge, NI has introduced a multi-instrument measurement technique that takes advantage of two NI vector signal transceivers (VSTs). The approach utilizes cross-correlation signal processing to improve measurement accuracy and achieve WiFi7 performance specifications. The new technique implements patented technology that allows engineers to reduce the time to perform extremely high dynamic range, wide bandwidth measurements by up to 100x when compared to traditional cross-correlation methods, depending on the scenario. The result reduces product characterization times, allowing test engineers to accelerate time to market. The EVM Measurement Technique described herein is protected by US Patent No. 10,841,019 and US Patent Publication No.: 20220065972.
“As Wi-Fi7 technology is driving ever increasing RF performance levels, NI continues to innovate with new measurement techniques that allow our customers to reach state-of-art performance while improving their test time and manufacturing yields,” said Chen Chang, Senior Director of Offering Management. “NI’s new patented fast cross-correlation measurement technique allows our customers to guarantee industry leading RF performance – and do so while accelerating their time to market.”
In addition to improving measurement performance, software-centric PXI automated test systems offer industry-leading flexibility and scalability. Through standardization of NI’s full platform of instrumentation from DC to mmWave, engineers can reduce overall characterization time while increasing test coverage. This allows NI customers to deliver higher product performance while accelerating the product development workflow.
If you would like a hands-on demo of NI’s Cross-Correlation Technology, NI will be at the IEEE’s Microwave Symposium in Denver
About NI
At NI, we bring together the people, ideas and technology so forward thinkers and creative problem solvers can take on humanity’s biggest challenges. From design and validation to manufacturing production, we provide software-connected systems leveraging data through all aspects of the development life cycle, enabling engineers and enterprises to Engineer Ambitiously™ every day.
The EVM Measurement Technique described herein is protected by US Patent No. 10,841,019 titled “Cross-Correlation Measurements for Modulation Quality Measurements,” and US Patent Publication No.: 20220065972 titled “Fast Convergence Method for Cross-Correlation Based Modulation Quality Measurements.”
View source version on businesswire.com: https://www.businesswire.com/news/home/20220616005126/en/
pr@ni.com
Source: NI
FAQ
What is the new measurement technique announced by NI (NATI)?
How does NI's new technique impact WLAN manufacturers?
What are the benefits of NI's patented technology for EVM measurements?