Keysight Unveils 3kV High Voltage Wafer Test System for Power Semiconductors
Keysight Technologies, Inc. (NYSE: KEYS) has introduced the 4881HV High Voltage Wafer Test System, expanding its semiconductor test portfolio. This new system enables parametric tests up to 3kV supporting high and low-voltage in one-pass test, improving productivity for power semiconductor manufacturers. Key features include:
1. A high-voltage switching matrix (HV-SWM) supporting up to 3kV requirements, scalable up to 29 pins.
2. One-pass testing capability, increasing efficiency and reducing footprint and testing time.
3. Enhanced safety features, including built-in protection circuitry and machine control.
4. Compliance with safety regulations, including SEMI S2 standards.
The system addresses the growing demand for power semiconductors, especially next-generation devices like silicon carbide (SiC) and gallium nitride (GaN), by enabling more accurate and efficient testing.
Keysight Technologies, Inc. (NYSE: KEYS) ha presentato il 4881HV High Voltage Wafer Test System, ampliando il suo portfolio di test per semiconduttori. Questo nuovo sistema consente test parametrici fino a 3kV, supportando test ad alta e bassa tensione in un'unica fase, migliorando la produttività per i produttori di semiconduttori di potenza. Le caratteristiche principali includono:
1. Una matrice di commutazione ad alta tensione (HV-SWM) che supporta esigenze fino a 3kV, scalabile fino a 29 pin.
2. Capacità di testing in un'unica fase, aumentando l'efficienza e riducendo l'ingombro e il tempo di test.
3. Caratteristiche di sicurezza avanzate, inclusi circuiti di protezione integrati e controlli della macchina.
4. Conformità alle normative di sicurezza, inclusi gli standard SEMI S2.
Il sistema risponde alla crescente domanda di semiconduttori di potenza, in particolare per dispositivi di nuova generazione come il carburo di silicio (SiC) e il nitruro di gallio (GaN), consentendo test più accurati ed efficienti.
Keysight Technologies, Inc. (NYSE: KEYS) ha presentado el 4881HV High Voltage Wafer Test System, ampliando su cartera de pruebas de semiconductores. Este nuevo sistema permite pruebas paramétricas de hasta 3kV, soportando pruebas de alta y baja tensión en una única pasada, mejorando la productividad para los fabricantes de semiconductores de potencia. Las características clave incluyen:
1. Una matriz de conmutación de alta tensión (HV-SWM) que soporta requisitos de hasta 3kV, escalable hasta 29 pines.
2. Capacidad de prueba en una sola pasada, aumentando la eficiencia y reduciendo el espacio y el tiempo de prueba.
3. Características de seguridad mejoradas, incluyendo circuitos de protección integrados y control de la máquina.
4. Cumplimiento con las regulaciones de seguridad, incluyendo las normas SEMI S2.
El sistema aborda la creciente demanda de semiconductores de potencia, especialmente dispositivos de próxima generación como carburo de silicio (SiC) y nitruro de galio (GaN), permitiendo pruebas más precisas y eficientes.
Keysight Technologies, Inc. (NYSE: KEYS)가 4881HV 고전압 웨이퍼 테스트 시스템을 출시하여 반도체 테스트 포트폴리오를 확장했습니다. 이 새로운 시스템은 3kV까지의 파라메트릭 테스트를 가능하게 하여 고전압 및 저전압 테스트를 한 번의 테스트로 지원하여 전력 반도체 제조업체의 생산성을 향상시킵니다. 주요 기능은 다음과 같습니다:
1. 최대 3kV의 요구 사항을 지원하며 최대 29핀까지 확장 가능한 고전압 스위칭 매트릭스 (HV-SWM).
2. 효율성을 높이고 공간 및 테스트 시간을 줄이는 단일 테스트 기능.
3. 내장된 보호 회로와 머신 제어를 포함한 향상된 안전 기능.
4. SEMI S2 표준을 포함한 안전 규정 준수.
이 시스템은 특히 실리콘 카바이드 (SiC) 및 질화 갈륨 (GaN)과 같은 차세대 장치에 대한 전력 반도체에 대한 증가하는 수요를 해결하여 보다 정확하고 효율적인 테스트를 가능하게 합니다.
Keysight Technologies, Inc. (NYSE: KEYS) a présenté le 4881HV High Voltage Wafer Test System, élargissant ainsi son portefeuille de tests de semi-conducteurs. Ce nouveau système permet des tests paramétriques jusqu'à 3kV, supportant les tests à haute et basse tension en un seul passage, améliorant ainsi la productivité des fabricants de semi-conducteurs de puissance. Les caractéristiques clés comprennent :
1. Une matrice de commutation haute tension (HV-SWM) supportant des exigences allant jusqu'à 3kV, évolutive jusqu'à 29 broches.
2. Capacité de test en une seule passe, augmentant l'efficacité et réduisant l'empreinte et le temps de test.
3. Fonctionnalités de sécurité améliorées, y compris des circuits de protection intégrés et le contrôle de la machine.
4. Conformité aux réglementations de sécurité, y compris les normes SEMI S2.
Le système répond à la demande croissante de semi-conducteurs de puissance, en particulier pour les dispositifs de prochaine génération tels que le carbure de silicium (SiC) et le nitrure de gallium (GaN), en permettant des tests plus précis et efficaces.
Keysight Technologies, Inc. (NYSE: KEYS) hat das 4881HV Hochspannungs-Wafer-Testsystem eingeführt, das sein Portfolio im Bereich Halbleiterprüfung erweitert. Dieses neue System ermöglicht parametrische Tests bis zu 3kV, die sowohl Hoch- als auch Niederspannungstests in einem Durchgang unterstützen und die Produktivität für Hersteller von Leistungshalbleitern steigern. Zu den Hauptmerkmalen gehören:
1. Eine Hochspannungs-Schaltmatrix (HV-SWM), die Anforderungen von bis zu 3kV unterstützt und bis zu 29 Pins skalierbar ist.
2. Ein Durchgangstestverfahren, das die Effizienz steigert und den Platzbedarf sowie die Testzeit reduziert.
3. Verbesserte Sicherheitsmerkmale, einschließlich integrierter Schutzschaltungen und Maschinenkontrolle.
4. Einhaltung von Sicherheitsvorschriften, einschließlich SEMI S2 Standards.
Das System reagiert auf die wachsende Nachfrage nach Leistungshalbleitern, insbesondere bei Next-Generation-Geräten wie Siliziumkarbid (SiC) und Gallium-Nitrid (GaN), indem es genauere und effizientere Tests ermöglicht.
- Introduction of a new high-voltage wafer test system expanding Keysight's semiconductor test portfolio
- Capability to perform parametric tests up to 3kV in one-pass, improving efficiency
- Potential to reduce testing time and footprint by eliminating the need for separate high and low-voltage test systems
- Addresses growing demand for power semiconductors, including next-generation devices like SiC and GaN
- None.
Insights
Keysight's new 4881HV High Voltage Wafer Test System represents a significant advancement in power semiconductor testing technology. This system addresses critical industry needs by enabling one-pass testing up to 3kV, combining high and low-voltage capabilities. This innovation could substantially reduce testing time and costs for manufacturers, potentially improving profit margins.
The system's ability to perform both process control monitoring (PCM) and wafer acceptance testing (WAT) in a single setup is particularly valuable. This consolidation of testing processes could lead to increased throughput and faster time-to-market for new power semiconductor products, which is important in the rapidly evolving markets for electric vehicles, renewable energy and industrial applications.
While the immediate impact on Keysight's financials may be , this product positions the company well in the growing power semiconductor market, especially for next-generation devices like SiC and GaN. Long-term, this could translate to increased market share and revenue growth in Keysight's semiconductor test segment.
The 4881HV system's one-pass testing capability is a game-changer for manufacturing efficiency. By eliminating the need for separate high and low-voltage testers, it offers significant benefits:
- Reduced capital expenditure on testing equipment
- Smaller factory footprint, freeing up valuable clean room space
- Streamlined workflows and reduced handling, potentially lowering defect rates
- Improved overall equipment effectiveness (OEE) through consolidated testing
The integration with Keysight's SPECS-FA software for factory automation further enhances these efficiency gains. This could lead to substantial cost savings and increased production capacity for semiconductor manufacturers, making the 4881HV an attractive investment despite its likely premium pricing.
The system's compliance with safety regulations, including SEMI S2 standards, also reduces regulatory risks and potential downtime, contributing to overall operational efficiency.
- Increased productivity and efficiency with one-pass test enabled by a high-voltage switching matrix
- Designed to enhance the safety of operators and equipment; complies with regulations
Keysight's 4881HV High Voltage Wafer Test System improves the productivity of power semiconductor manufacturers by enabling parametric tests up to 3kV supporting high and low-voltage in one-pass test. (Photo: Business Wire)
Manufacturers have traditionally measured wafers using separate testers for high and low voltages. However, demand for power semiconductors is rapidly growing due to their multifunctionality, higher performance, and next-generation devices such as silicon carbide (SiC) and gallium nitride (GaN). As a result, customers need a solution to more accurately and efficiently test their devices and reduce time to market.
Keysight’s solution addresses these challenges by allowing power device makers to perform process control monitoring (PCM) and wafer acceptance testing (WAT) in manufacturing. The new test system delivers the following benefits:
- High-Voltage Capability to Meet Future Needs: The high-voltage switching matrix (HV-SWM) supports up to 3kV requirements, is scalable up to 29 pins, and integrates with precision source measure units (SMUs). It enables highly flexible measurements from low current down to sub-pA resolution up to 3kV at any pins. Additionally, high-voltage capacitance measurement and various parametric tests are supported.
- One-pass Testing Increases Productivity and Efficiency: The HV-SWM enables a single test system instead of separate high-voltage and low-voltage test systems. Utilizing one system is more efficient and reduces the required footprint and testing time. The system integrates with factory automation environments using Keysight’s SPECS-FA software, which improves the efficiency of the entire production process.
- Enhanced Safety and Reliability: The test system has built-in protection circuitry and machine control, ensuring operators and equipment are not impacted by high-voltage surges during a test, and is compliant with safety regulations, including SEMI S2 standards.
Shinji Terasawa, Vice President and General Manager of Keysight's Wafer Test Solutions, said: “Keysight is thrilled to introduce our new wafer test system for power semiconductors, building on our long tenure of testing advanced semiconductors. Our mission is to lead the market by providing cutting-edge solutions that anticipate and meet the rapidly evolving needs of the semiconductor sector. This latest innovation exemplifies our unwavering commitment to the industry.”
Resources
- Product: Keysight 4881HV High Voltage Wafer Test System
- Brochure: Keysight 4881HV High Voltage Wafer Test System
About Keysight Technologies
At Keysight (NYSE: KEYS), we inspire and empower innovators to bring world-changing technologies to life. As an S&P 500 company, we’re delivering market-leading design, emulation, and test solutions to help engineers develop and deploy faster, with less risk, throughout the entire product life cycle. We’re a global innovation partner enabling customers in communications, industrial automation, aerospace and defense, automotive, semiconductor, and general electronics markets to accelerate innovation to connect and secure the world. Learn more at Keysight Newsroom and www.keysight.com.
View source version on businesswire.com: https://www.businesswire.com/news/home/20241008823685/en/
Keysight Media Contacts
North America PR Team
pdl-americas-keysight-pr@keysight.com
Fusako Dohi
+81 42 660-2162
fusako_dohi@keysight.com
Jenny Gallacher
+44 (0) 7800 737 982
jenny.gallacher@keysight.com
Source: Keysight Technologies, Inc.
FAQ
What is the maximum voltage capability of Keysight's new 4881HV High Voltage Wafer Test System?
How does the 4881HV system improve productivity for power semiconductor manufacturers?
What safety features does Keysight's 4881HV High Voltage Wafer Test System include?
How many pins can the high-voltage switching matrix (HV-SWM) in Keysight's 4881HV system support?
