CyberOptics to Deliver Technical Presentation About the Importance of 3D Inspection for Advanced Packaging at SEMICON Taiwan
CyberOptics Corporation (NASDAQ: CYBE) will present a technical demonstration titled ‘3D Inspection Is Becoming Essential in Advanced Packaging’ at the Heterogeneous Integration Global Summit in Taipei from December 1-3. The company will showcase its WX3000™ Metrology and Inspection system, equipped with a 3 µm NanoResolution MRS sensor. This technology offers sub-micrometer accuracy, significantly enhancing inspection speed and quality in advanced packaging applications.
Dr. Charlie Zhu will present on December 2, highlighting the increasing need for high-precision 3D inspection in semiconductor manufacturing.
- Showcasing innovative WX3000™ Metrology and Inspection system with advanced 3D sensing technology.
- Presentation by Dr. Charlie Zhu highlights CyberOptics' leadership in addressing critical inspection challenges in semiconductor manufacturing.
- Increasing demand for 3D inspection technology aligns with market trends in advanced packaging.
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Paper Titled ‘3D Inspection Is Becoming Essential in Advanced Packaging (AP)’
Dr.
Advanced Packaging continues to be among the most dynamic and rapidly evolving areas of semiconductor development and manufacturing. Most of these new processes take advantage of the third dimension, going vertical to continue packing more computing power into less space while circumventing the difficulties posed by further reductions in two-dimensional size.
As the processes and features they create have become smaller and more complex, manufacturers face an increasing need for high-precision inspection and measurement to detect defects and improve process control. As a result, the traditional 2D-based inspections can no longer satisfy the needs for quality control where 3D inspection is becoming essential. A growing number of applications in the AP process are requiring full 3D inspection instead of sampling and the trend is expected to continue. However, the traditional 3D inspection systems are either slow or inaccurate which means they are unable to meet the growing demand of AP.
This presentation will elaborate on the needs and challenges of 3D inspection in various AP applications such as
At the show, the company will feature the WX3000™ Metrology and Inspection system powered by the 3 µm NanoResolution MRS sensor that provides sub-micrometer accuracy on features as small as 25µm. The system is specifically designed for wafer-level and advanced packaging applications. While retaining its ability to reject spurious multiple reflections, it adds the ability to capture and analyze specular reflections from shiny surfaces of solder balls, bumps and pillars, allowing highly accurate inspection and metrology of these critical packaging features. Fast,
For more information, visit www.cyberoptics.com.
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