Aehr Test Systems to Participate in the Needham Virtual Semiconductor and SemiCap 1x1 Conference on August 21
Aehr Test Systems (NASDAQ:AEHR), a global supplier of semiconductor test and burn-in equipment, will participate in the 5th Annual Needham Virtual Semiconductor and SemiCap 1x1 Conference on August 21, 2024. CEO Gayn Erickson and CFO Chris Siu will host virtual investor meetings throughout the day.
The company plans to discuss its wafer level test and package part burn-in solutions for semiconductor production, including their recent acquisition of Incal Technology and new high-power packaged part reliability/burn-in test solutions. These innovations expand Aehr's addressable market within the rapidly growing artificial intelligence (AI) semiconductor sector.
Aehr's solutions cater to various semiconductor types, including silicon carbide devices for electric vehicles, gallium nitride devices for power conversion, and silicon photonics devices for data centers and 5G infrastructure. The adoption of these technologies is a significant growth driver for Aehr Test.
Aehr Test Systems (NASDAQ:AEHR), fornitore globale di apparecchiature per test e burn-in di semiconduttori, parteciperà alla 5° Conferenza Virtuale Annuale sui Semiconduttori e SemiCap 1x1 di Needham il 21 agosto 2024. Il CEO Gayn Erickson e il CFO Chris Siu ospiteranno riunioni virtuali con gli investitori durante tutta la giornata.
La società prevede di discutere le proprie soluzioni di test a livello di wafer e di burn-in per parti imballate nella produzione di semiconduttori, inclusa l'acquisizione recente di Incal Technology e le nuove soluzioni di test di affidabilità/burn-in per parti imballate ad alta potenza. Queste innovazioni ampliano il mercato indirizzabile di Aehr all'interno dell'intraprendente settore dei semiconduttori per intelligenza artificiale (AI).
Le soluzioni di Aehr sono dedicate a vari tipi di semiconduttori, tra cui dispositivi in carburo di silicio per veicoli elettrici, dispositivi in nitruro di gallio per la conversione di potenza, e dispositivi in fotonica silicio per centri dati e infrastrutture 5G. L'adozione di queste tecnologie rappresenta un importante motore di crescita per Aehr Test.
Aehr Test Systems (NASDAQ:AEHR), proveedor global de equipos de prueba y burn-in para semiconductores, participará en la 5ª Conferencia Virtual Anual de Semiconductores y SemiCap 1x1 de Needham el 21 de agosto de 2024. El CEO Gayn Erickson y el CFO Chris Siu realizarán reuniones virtuales con inversores a lo largo del día.
La empresa planea discutir sus soluciones de prueba a nivel de oblea y de burn-in para partes empaquetadas en la producción de semiconductores, incluida su reciente adquisición de Incal Technology y nuevas soluciones de prueba de confiabilidad/burn-in para partes empaquetadas de alta potencia. Estas innovaciones expanden el mercado accesible de Aehr dentro del rápidamente creciente sector de semiconductores para inteligencia artificial (AI).
Las soluciones de Aehr están diseñadas para varios tipos de semiconductores, incluyendo dispositivos de carburo de silicio para vehículos eléctricos, dispositivos de nitruro de galio para conversión de potencia, y dispositivos de fotónica de silicio para centros de datos e infraestructura 5G. La adopción de estas tecnologías es un importante impulsor de crecimiento para Aehr Test.
Aehr Test Systems (NASDAQ:AEHR)는 반도체 테스트 및 번인 장비의 글로벌 공급업체로, 2024년 8월 21일에 열리는 제5회 Needham 가상 반도체 및 SemiCap 1x1 컨퍼런스에 참여합니다. CEO Gayn Erickson과 CFO Chris Siu는 하루 종일 가상 투자자 미팅을 주최할 예정입니다.
회사는 최근 Incal Technology 인수와 고전력 포장 부분의 신뢰성/번인 테스트 솔루션을 포함하여 반도체 생산을 위한 웨이퍼 수준 테스트 및 포장 부품 번인 솔루션에 대해 논의할 계획입니다. 이러한 혁신은 Aehr의 인공지능(AI) 반도체 분야 내에서의 시장 확대를 의미합니다.
Aehr의 솔루션은 전기차를 위한 실리콘 카바이드 장치, 전력 변환을 위한 갈륨 나이트라이드 장치, 데이터 센터 및 5G 인프라를 위한 실리콘 포토닉 장치 등 다양한 반도체 유형을 지원합니다. 이러한 기술의 채택은 Aehr Test에 중요한 성장 동력이 됩니다.
Aehr Test Systems (NASDAQ:AEHR), fournisseur mondial d'équipements de test et de burn-in pour semi-conducteurs, participera à la 5ème conférence virtuelle annuelle Needham sur les semi-conducteurs et SemiCap 1x1 le 21 août 2024. Le PDG Gayn Erickson et le directeur financier Chris Siu organiseront des réunions virtuelles avec les investisseurs tout au long de la journée.
La société prévoit de discuter de ses solutions de test au niveau de la plaquette et de burn-in pour les pièces emballées dans la production de semi-conducteurs, y compris l'acquisition récente d'Incal Technology et de nouvelles solutions de test de fiabilité/burn-in pour les pièces emballées à haute puissance. Ces innovations élargissent le marché adressable d'Aehr dans le secteur des semi-conducteurs pour intelligence artificielle (IA) en forte croissance.
Les solutions d'Aehr s'adressent à divers types de semi-conducteurs, notamment des dispositifs en carbure de silicium pour véhicules électriques, des dispositifs en nitrure de gallium pour la conversion d'énergie, et des dispositifs en photonique silicium pour les centres de données et les infrastructures 5G. L'adoption de ces technologies représente un moteur de croissance important pour Aehr Test.
Aehr Test Systems (NASDAQ:AEHR), ein globaler Anbieter von Test- und Burn-In-Ausrüstung für Halbleiter, wird am 21. August 2024 an der 5. jährlichen virtuellen Needham-Halbleiter- und SemiCap 1x1-Konferenz teilnehmen. CEO Gayn Erickson und CFO Chris Siu werden den ganzen Tag über virtuelle Investorenmeetings abhalten.
Das Unternehmen plant, seine Wafer-Level-Test- und Packungsteil-Burn-In-Lösungen für die Halbleiterproduktion zu besprechen, einschließlich der kürzlichen Akquisition von Incal Technology und neuer Hochleistungs-Testlösungen für Zuverlässigkeit/Burn-In. Diese Innovationen erweitern den adressierbaren Markt von Aehr im schnell wachsenden Bereich Halbleiter für künstliche Intelligenz (AI).
Die Lösungen von Aehr richten sich an verschiedene Halbleitertypen, einschließlich Siliziumkarbidgeräten für Elektrofahrzeuge, Gallium-Nitrid-Geräten zur Energieumwandlung und Silizium-Photonik-Geräten für Rechenzentren und 5G-Infrastruktur. Die Einführung dieser Technologien ist ein wesentlicher Wachstumstreiber für Aehr Test.
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FREMONT, CA / ACCESSWIRE / August 19, 2024 / Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that it will participate in the 5th Annual Needham Virtual Semiconductor and SemiCap 1x1 Conference on Wednesday, August 21, 2024.
Aehr Test President and CEO Gayn Erickson and CFO Chris Siu will be hosting virtual meetings with investors throughout the day.
"We look forward to discussing with investors and shareholders our unique wafer level test and package part burn-in solutions for semiconductor production and the markets they serve, including our recently closed acquisition of Incal Technology and new high power packaged part reliability/burn-in test solutions that expand our addressable market within the rapidly growing artificial intelligence (AI) semiconductor market," said Mr. Erickson. "Aehr Test provides complete turn-key solutions for improving quality, reliability, and yield of semiconductors such as silicon carbide devices used in electric vehicles and charging infrastructure, gallium nitride devices for multiple power conversion applications, and silicon photonics devices used in data centers and 5G infrastructure and optical input/output (I/O) and co-packaged optics devices as well as AI processors in both wafer level and packaged part device forms. The adoption of wafer level test and packaged parts burn-in of these devices is a significant growth driver for Aehr Test."
For additional information, or to schedule a virtual meeting with Aehr management, please contact your Needham representative, or Aehr's investor relations firm, MKR Investor Relations, at aehr@mkr-group.com.
About Aehr Test Systems
Headquartered in Fremont, California, Aehr Test Systems is a leading provider of test solutions for testing, burning-in, and stabilizing semiconductor devices in wafer level, singulated die, and package part form, and has installed thousands of systems worldwide. Increasing quality, reliability, safety, and security needs of semiconductors used across multiple applications, including electric vehicles, electric vehicle charging infrastructure, solar and wind power, computing, data and telecommunications infrastructure, and solid-state memory and storage, are driving additional test requirements, incremental capacity needs, and new opportunities for Aehr Test products and solutions. Aehr has developed and introduced several innovative products including the FOX-PTM families of test and burn-in systems and FOX WaferPakTM Aligner, FOX WaferPak Contactor, FOX DiePak® Carrier and FOX DiePak Loader. The FOX-XP and FOX-NP systems are full wafer contact and singulated die/module test and burn-in systems that can test, burn-in, and stabilize a wide range of devices such as leading-edge silicon carbide-based and other power semiconductors, 2D and 3D sensors used in mobile phones, tablets, and other computing devices, memory semiconductors, processors, microcontrollers, systems-on-a-chip, and photonics and integrated optical devices. The FOX-CP system is a low-cost single-wafer compact test solution for logic, memory and photonic devices and the newest addition to the FOX-P product family. The FOX WaferPak Contactor contains a unique full wafer contactor capable of testing wafers up to 300mm that enables IC manufacturers to perform test, burn-in, and stabilization of full wafers on the FOX-P systems. The FOX DiePak Carrier allows testing, burning in, and stabilization of singulated bare die and modules up to 1024 devices in parallel per DiePak on the FOX-NP and FOX-XP systems up to nine DiePaks at a time. Acquired through its acquisition of Incal Technology, Inc., Aehr's new line of high-power packaged part reliability/burn-in test solutions for Artificial Intelligence (AI) semiconductor manufacturers, including its ultra-high-power Sonoma family of test solutions for AI accelerators, GPUs, and high-performance computing (HPC) processors, position Aehr within the rapidly growing AI market as a turn-key provider of reliability and testing that span from engineering to high volume production. For more information, please visit Aehr Test Systems' website at www.aehr.com.
CONTACTS:
Aehr Test Systems
Chris Siu
Chief Financial Officer
csiu@aehr.com
MKR Investor Relations Inc.
Todd Kehrli or Jim Byers
Analyst/Investor Contact
(323) 468-2300
aehr@mkr-group.com
SOURCE: Aehr Test Systems
View the original press release on accesswire.com
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