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Aehr Test Systems to Participate at Craig-Hallum Alpha Select Virtual Conference on November 16, 2021

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Aehr Test Systems (NASDAQ: AEHR) announced participation in the Craig-Hallum 12th Annual Alpha Select Virtual Conference on November 16, 2021. CEO Gayn Erickson and CFO Ken Spink will host investor meetings to discuss their semiconductor testing solutions.

Mr. Erickson highlighted that their products enhance semiconductor yield and reliability, particularly for silicon carbide devices in electric vehicles and silicon photonics for data centers. Continued demand in these markets is expected to drive significant revenue for AEHR in the upcoming fiscal year.

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FREMONT, Calif., Nov. 09, 2021 (GLOBE NEWSWIRE) -- Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of semiconductor test and reliability qualification equipment, today announced that it will participate at the Craig-Hallum 12th Annual Alpha Select Virtual Conference on Tuesday, November 16, 2021.

Aehr Test President and CEO Gayn Erickson and CFO Ken Spink will be hosting virtual meetings with investors throughout the day.

“We look forward to discussing our semiconductor wafer level and singulated die test and burn-in solutions and the markets they serve with investors,” said Mr. Erickson. “Aehr Test provides complete production solutions for improving yield and reliability of semiconductors, and devices such as silicon carbide semiconductors used in electric and hybrid electric vehicles, silicon photonics devices used in data centers and 5G infrastructure, and 2D/3D and other sensors used in mobile and wearable applications, which are expected to be significant revenue drivers for our products this fiscal year and next.”

For additional information, or to schedule a virtual meeting with Aehr management, please contact your Craig-Hallum representative, or Aehr’s investor relations firm, MKR Investor Relations, at aehr@mkr-group.com.

About Aehr Test Systems
Headquartered in Fremont, California, Aehr Test Systems is a worldwide provider of test systems for burning-in and testing logic, optical and memory integrated circuits and has installed over 2,500 systems worldwide. Increased quality and reliability needs of the Automotive and Mobility integrated circuit markets are driving additional test requirements, incremental capacity needs, and new opportunities for Aehr Test products in package, wafer level, and singulated die/module level test. Aehr Test has developed and introduced several innovative products, including the ABTSTM and FOX-PTM families of test and burn-in systems and FOX WaferPakTM Aligner, FOX-XP WaferPak Contactor, FOX DiePak® Carrier and FOX DiePak Loader. The ABTS system is used in production and qualification testing of packaged parts for both lower power and higher power logic devices as well as all common types of memory devices. The FOX-XP and FOX-NP systems are full wafer contact and singulated die/module test and burn-in systems used for burn-in and functional test of complex devices, such as leading-edge memories, digital signal processors, microprocessors, microcontrollers, systems-on-a-chip, and integrated optical devices. The FOX-CP system is a new low-cost single-wafer compact test and reliability verification solution for logic, memory and photonic devices and the newest addition to the FOX-P product family. The WaferPak contactor contains a unique full wafer probe card capable of testing wafers up to 300mm that enables IC manufacturers to perform test and burn-in of full wafers on Aehr Test FOX systems. The DiePak Carrier is a reusable, temporary package that enables IC manufacturers to perform cost-effective final test and burn-in of both bare die and modules. For more information, please visit Aehr Test Systems’ website at www.aehr.com.

Contacts: 
  
Aehr Test SystemsMKR Investor Relations Inc.
Ken SpinkTodd Kehrli or Jim Byers
Chief Financial OfficerAnalyst/Investor Contact
(510) 623-9400 x309(323) 468-2300
  aehr@mkr-group.com

FAQ

What conference will Aehr Test Systems participate in on November 16, 2021?

Aehr Test Systems will participate in the Craig-Hallum 12th Annual Alpha Select Virtual Conference.

Who will represent Aehr Test Systems at the Craig-Hallum conference?

CEO Gayn Erickson and CFO Ken Spink will represent Aehr Test Systems.

What topics will Aehr Test Systems discuss at the conference?

They will discuss their semiconductor wafer level and singulated die test and burn-in solutions.

What markets are expected to drive revenue for Aehr Test Systems?

Key markets include silicon carbide semiconductors for electric vehicles and silicon photonics for data centers.

How many systems has Aehr Test Systems installed worldwide?

Aehr Test Systems has installed over 2,500 systems globally.

Aehr Test Systems

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Semiconductor Equipment & Materials
Instruments for Meas & Testing of Electricity & Elec Signals
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